TEHRAN (FNA)- Iranian researchers have developed an Atomic Force Microscope (AFM) putting the country among ten leading countries possessing this nano-technology.
Atomic force microscopy employs a cantilever so small that its tip tapers to a nanoscale point which provides scientists with an advanced imaging method in nanoscale points. As the microscope scans, the cantilever bounces up and down in response to the miniscule forces between the tip and the sample, generating a picture of the sample's surface.
The project provides an innovative way in nano processing. It can make movements at nanoscale of any function and sensor possible.
The atomic force microscope, which offers a precise duplication of any material surface, is an advanced technique capable of developing the most accurate picture in research processes, press tv reported.
Producing such a device puts Iran among ten leading countries possessing this nano-technology.