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MIT 2.830J, Control of Manufacturing Processes S08

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The objective of this subject is to understand the nature of manufacturing process variation and the methods for its control. First, a general process model for control is developed to understand the limitations a specific process places on the type of control used. A general model for process variation is presented and three methods are developed to minimize variations: Statistical Process Control, Process Optimization and in-process Feedback Control. These are considered in a hierarchy of cost-performance tradeoffs, where performance is based on changes in process capability. This course was also taught as part of the Singapore-MIT Alliance (SMA) programme as course number SMA 6306 (Manufacturing Physics III: Process Optimization and Control).

View the complete course: http://ocw.mit.edu/2-830JS08

License: Creative Commons BY-NC-SA
More information at http://ocw.mit.edu/terms
More courses at http://ocw.mit.edu

The objective of this subject is to understand the nature of manufacturing process variation and the methods for its control. First, a general process model for control is developed to understand the limitations a specific process places on the type of control used. A general model for process variation is presented and three methods are developed to minimize variations: Statistical Process Control, Process Optimization and in-process Feedback Control. These are considered in a hierarchy of cost-performance tradeoffs, where performance is based on changes in process capability. This course was also taught as part of the Singapore-MIT Alliance (SMA) programme as course number SMA 6306 (Manufacturing Physics III: Process Optimization and Control).

View the complete course: http://ocw.mit.edu/2-830JS08

License: Creative Commons BY-NC-SA
More information at http://ocw.mit.edu/terms
More courses at http://ocw.mit.edu
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  1. Thumbnail 1:05:13
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    Lec 1 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 25,505 views

    Lecture 1: Introduction -- processes and variation framework
    Instructor: Duane Boning, David Hardt
    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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  2. Thumbnail 1:25:16
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    Lec 2 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 14,727 views

    Lecture 2: Semiconductor process variation

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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  3. Thumbnail 1:27:21
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    Lec 3 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 5,990 views

    Lecture 3: Mechanical process variation -- physical causes and interpreting data

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
    More information at http://ocw.mit.edu/terms
    More courses at http://ocw.mit.edu

  4. Thumbnail 1:22:35
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    Lec 4 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 2,853 views

    Lecture 4: Probability models of manufacturing processes

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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  5. Thumbnail 1:21:32
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    Lec 5 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 1,873 views

    Lecture 5: Probability models, parameter estimation, and sampling

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
    More information at http://ocw.mit.edu/terms
    More courses at http://ocw.mit.edu

  6. Thumbnail 1:21:21
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    Lec 6 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 1,410 views

    Lecture 6: Sampling distributions and statistical hypotheses

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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    More courses at http://ocw.mit.edu

  7. Thumbnail 1:20:39
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    Lec 7 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 5,671 views

    Lecture 7: Shewhart SPC and process capability

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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  8. Thumbnail 1:20:04
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    Lec 8 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 1,777 views

    Lecture 8: Process capability and alternative SPC methods

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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    Lec 9 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 1,499 views

    Lecture 9: Advanced and multivariate SPC

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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    Lec 10 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 1,141 views

    Lecture 10: Yield modeling

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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    Lec 11 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 1,586 views

    Lecture 11: Introduction to analysis of variance

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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    Lec 12 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 1,030 views

    Lecture 12: Full factorial models

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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    Lec 13 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 960 views

    Lecture 13: Modeling testing and fractional factorial models

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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    Lec 14 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 805 views

    Lecture 14: Aliasing and higher order models

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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    Lec 15 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 2,257 views

    Lecture 15: Response surface modeling and process optimization

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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    Lec 16 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 1,114 views

    Lecture 16: Process robustness

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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    More courses at http://ocw.mit.edu

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    Lec 17 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 763 views

    Lecture 17: Nested variance components

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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    Lec 18 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 1,653 views

    Lecture 18: Sequential experimentation: Experimentation and Robust Design and Engineering Systems. (Courtesy of Dan Frey. Used with permission.)

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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    Lec 19 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 1,270 views

    Lecture 19: Case study 1: tungsten CVD DOE/RSM

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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  20. Thumbnail 1:23:17
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    Lec 20 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 1,222 views

    Lecture 20: Case study 2: cycle to cycle control

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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  21. Thumbnail 1:52:34
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    Lec 21 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 892 views

    Lecture 21: Case study 3: spatial modeling

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
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  22. Thumbnail 1:20:51
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    Lec 22 | MIT 2.830J Control of Manufacturing Processes, S08

    by MIT 1,542 views

    Lecture 22: Case study 4: Modeling the Embossing/Imprinting of Thermoplastic Layers. (Courtesy of Hayden Taylor. Used with permission.)

    Instructor: Duane Boning, David Hardt

    View the complete course at: http://ocw.mit.edu/2-830JS08

    License: Creative Commons BY-NC-SA
    More information at http://ocw.mit.edu/terms
    More courses at http://ocw.mit.edu

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