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1 - 1 of 1 results for: GES 286: Secondary Ionization Mass Spectrometry

GES 286: Secondary Ionization Mass Spectrometry

Secondary ionization mass spectrometry (SIMS) is a versatile method capable of performing elemental and isotopic analysis in the solid-state at the nanogram to picogram scale. SIMS offers the most favorable combination of high spatial resolution, sensitivity, and mass resolving power. This course explores the ion optics of the primary and secondary columns of SIMS instruments and explains instrumental mass fractionation and standardization methods for both positive and negative secondary ions. Ion imaging and depth profiling approaches are also covered. Practical experience using Stanford's SHRIMP-RG and NanoSIMS instruments is provided.
Terms: Aut | Units: 3 | Grading: Letter or Credit/No Credit
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