Bob Sinclair

All Publications

• A Scanning Transmission Electron Microscopy Approach to Analyzing Large Volumes of Tissue to Detect Nanoparticles MICROSCOPY AND MICROANALYSIS Kempen, P. J., Thakor, A. S., Zavaleta, C., Gambhir, S. S., Sinclair, R. 2013; 19 (5): 1290-1297

  Abstract

  The use of nanoparticles for the diagnosis and treatment of cancer requires the complete characterization of their toxicity, including accurately locating them within biological tissues. Owing to their size, traditional light microscopy techniques are unable to resolve them. Transmission electron microscopy provides the necessary spatial resolution to image individual nanoparticles in tissue, but is severely limited by the very small analysis volume, usually on the order of tens of cubic microns. In this work, we developed a scanning transmission electron microscopy (STEM) approach to analyze large volumes of tissue for the presence of polyethylene glycol-coated Raman-active-silica-gold-nanoparticles (PEG-R-Si-Au-NPs). This approach utilizes the simultaneous bright and dark field imaging capabilities of STEM along with careful control of the image contrast settings to readily identify PEG-R-Si-Au-NPs in mouse liver tissue without the need for additional time-consuming analytical characterization. We utilized this technique to analyze 243,000 μm3 of mouse liver tissue for the presence of PEG-R-Si-Au-NPs. Nanoparticles injected into the mice intravenously via the tail vein accumulated in the liver, whereas those injected intrarectally did not, indicating that they remain in the colon and do not pass through the colon wall into the systemic circulation.

  View details for DOI 10.1017/S143192761300192X

  View details for Web of Science ID 000324550900022

  View details for PubMedID 23803218

• Atomic layer deposition of CdO and CdxZn1-xO films MATERIALS CHEMISTRY AND PHYSICS Bakke, J. R., Haegglund, C., Jung, H. J., Sinclair, R., Bent, S. F. 2013; 140 (2-3): 465-471

  View details for DOI 10.1016/j.matchemphys.2013.03.038

  View details for Web of Science ID 000320837700008

• Aberration-Corrected TEM Imaging of Oxygen Occupancy in YSZ JOURNAL OF PHYSICAL CHEMISTRY LETTERS An, J., Koh, A. L., Park, J. S., Sinclair, R., Guer, T. M., Prinz, F. B. 2013; 4 (7): 1156-1160

  View details for DOI 10.1021/jz4002423

  View details for Web of Science ID 000317317500017

• Observations of Carbon Nanotube Oxidation in an Aberration-Corrected Environmental Transmission Electron Microscope ACS NANO Koh, A. L., Gidcumb, E., Zhou, O., Sinclair, R. 2013; 7 (3): 2566-2572

  Abstract

  We report the first direct study on the oxidation of carbon nanotubes at the resolution of an aberration-corrected environmental transmission electron microscope (ETEM), as we locate and identify changes in the same nanotubes as they undergo oxidation at increasing temperatures in situ in the ETEM. Contrary to earlier reports that CNT oxidation initiates at the end of the tube and proceeds along its length, our findings show that only the outside graphene layer is being removed and, on occasion, the interior inner wall is oxidized, presumably due to oxygen infiltrating into the hollow nanotube through an open end or breaks in the tube. We believe that this work provides the foundation for a greater scientific understanding of the mechanism underlying the nanotube oxidation process, as well as guidelines to manipulate the nanotubes' structure or prevent their oxidation.

  View details for DOI 10.1021/nn305949h

  View details for Web of Science ID 000316846700075

  View details for PubMedID 23360330

• Spatial Variation of Available Electronic Excitations within Individual Quantum Dots NANO LETTERS Jung, H. J., Dasgupta, N. P., Van Stockum, P. B., Koh, A. L., Sinclair, R., Prinz, F. B. 2013; 13 (2): 716-721

  Abstract

  Quantum dots (QDs) allow for manipulation of the position and energy levels of electrons at sub-10 nm length scales through control of material chemistry, size, and shape. It is known from optical studies that the bandgap of semiconductor QDs increases as their size decreases due to the narrowing of the quantum confinement potential. The mechanism of quantum confinement also indicates that the localized properties within individual QDs should depend on their shape in addition to their size, but direct observations of this effect have proven challenging due to the limited spatial resolution of measurement techniques at this scale and the ability to remove contributions from the surroundings. Here we present experimental evidence of spatial variations in the lowest available electron transition energy within a series of single electrically isolated QDs due to a dome-shaped geometry, measured using electron energy-loss spectroscopy in a (scanning) transmission electron microscope [(S)TEM-EELS]. We observe a consistent increase in the energy onset of electronic excitations from the lateral center of the dot toward the edges, which we attribute purely to shape. This trend is in qualitative agreement with a simple quantum simulation of the local density of states in a dome-shaped QD.

  View details for DOI 10.1021/nl304400c

  View details for Web of Science ID 000315079500065

  View details for PubMedID 23276278

• Codoping titanium dioxide nanowires with tungsten and carbon for enhanced photoelectrochemical performance. Nature communications Cho, I. S., Lee, C. H., Feng, Y., Logar, M., Rao, P. M., Cai, L., Kim, D. R., Sinclair, R., Zheng, X. 2013; 4: 1723-?

  Abstract

  Recent density-functional theory calculations suggest that codoping TiO2 with donor-acceptor pairs is more effective than monodoping for improving photoelectrochemical water-splitting performance because codoping can reduce charge recombination, improve material quality, enhance light absorption and increase solubility limits of dopants. Here we report a novel ex-situ method to codope TiO2 with tungsten and carbon (W, C) by sequentially annealing W-precursor-coated TiO2 nanowires in flame and carbon monoxide gas. The unique advantages of flame annealing are that the high temperature (>1,000 °C) and fast heating rate of flame enable rapid diffusion of W into TiO2 without damaging the nanowire morphology and crystallinity. This is the first experimental demonstration that codoped TiO2:(W, C) nanowires outperform monodoped TiO2:W and TiO2:C and double the saturation photocurrent of undoped TiO2 for photoelectrochemical water splitting. Such significant performance enhancement originates from a greatly improved electrical conductivity and activity for oxygen-evolution reaction due to the synergistic effects of codoping.

  View details for DOI 10.1038/ncomms2729

  View details for PubMedID 23591890

• Locating and Characterizing Self-Assembled Gadolinium Chelate Nanoparticles in Stem Cells Using TEM Kempen, P., J., Nejadnik, H., Ye, D., Rutt, B., K., Rao, J., Daldrup-Link, H., E., Sinclair, R. 2013
• Amorphous Thin Film TaWSiC as a Diffusion Barrier for Copper Interconnects Appl. Phys. Lett. Wongpiya, R., Ouyang, J., Kim, T., R., Deal, M., Sinclair, R., Nishi, Y. 2013; 103: 22104

  View details for DOI 10.1063/1.4813396

• Codoping Titanium Dioxide Nanowires with (W, C) for Enhancing Photoelectrochemical Performance Nature Communications Cho, I., S., Lee, C., H., Feng, Y., Logar, M., Rao, P., M., Cai, L., Sinclair, R. 2013; 4: 1723

  View details for DOI 10.1038/ncomms2729

• Oxidation Studies of Carbon Nanotubes for Applications as X-Ray Field Emitters Using an Aberration-Corrected, Environmental TEM Sinclair, R. 2013
• Advanced Characterization Techniques for Nanoparticles for Cancer Research: Applications of SEM and NanoSIMS for Locating Au Nanoparticles in Cells Kempen, P., J., Hitzman, C., Sasportas, L., S., Gambhir, S., S., Sinclair, R. 2013
• A Correlative Light Microscopy and Scanning Electron Microscopy Approach to Locating Raman Active Gold Core Nanoparticles in Tissue Sections Kempen, P., J., Kircher, M., F., Jokerst, J., V., Zavaleta, C., L., Gambhir, S., S., Sinclair, R. 2013
• In Situ High-Resolution Transmission Electron Microscopy of Materials Reactions Mat. Res. Soc. Bull. Sinclair, R. 2013; 38: 1065-1071
• Atomic Scale Verification of Oxide-Ion Vacancy Distribution near a Single Grain Boundary in YSZ Scientific Reports An, J., Park, J., S., Koh, A., L., Lee, H., B., Jung, H., J., Sinclair, R. 2013; 3: 2680

  View details for DOI 10.1038/srep02680

• HREM Analysis of Graphite-Encapsulated Metallic Nanoparticles for Possible Medical Applications Ultramicroscopy  Sinclair, R., Li, H., Madsen, S., Dai, H. 2013; 134: 167-174
• A Scanning Transmission Electron Microscopy (STEM) Technique to Analyze ‘Large’ Volumes of Tissue to Detect Nanoparticles Microscopy and Microanalysis Kempen, P., J., Thakor, A., S., Zavaleta, C., L., Gambhir, S., S., Sinclair, R. 2013; 5 (19): 1290-1297
• Chracterization of E-Beam Fabricated Gold Nanoparticles Madsen, S., Kempen, P., J., Sinclair, R. 2013
• NorTEMnet 2013 Workshop on Advanced Transmission Electron Microscopy Olsson, E., Sinclair, R., Jaeger, W. 2013
• Observations of Carbon Nanotube Oxidation in an Aberration-Corrected, Environmental Transmission Electron Microscope ACS nano  Koh, A., L., Gidcumb, E., Zhou, O., Sinclair, R. 2013; 3 (7): 2566-2572

  View details for DOI 10.1021/nn305949h

• Atomic scale verification of oxide-ion vacancy distribution near a single grain boundary in YSZ. Scientific reports An, J., Park, J. S., Koh, A. L., Lee, H. B., Jung, H. J., Schoonman, J., Sinclair, R., Gür, T. M., Prinz, F. B. 2013; 3: 2680-?

  Abstract

  This study presents atomic scale characterization of grain boundary defect structure in a functional oxide with implications for a wide range of electrochemical and electronic behavior. Indeed, grain boundary engineering can alter transport and kinetic properties by several orders of magnitude. Here we report experimental observation and determination of oxide-ion vacancy concentration near the Σ13 (510)/[001] symmetric tilt grain-boundary of YSZ bicrystal using aberration-corrected TEM operated under negative spherical aberration coefficient imaging condition. We show significant oxygen deficiency due to segregation of oxide-ion vacancies near the grain-boundary core with half-width < 0.6 nm. Electron energy loss spectroscopy measurements with scanning TEM indicated increased oxide-ion vacancy concentration at the grain boundary core. Oxide-ion density distribution near a grain boundary simulated by molecular dynamics corroborated well with experimental results. Such column-by-column quantification of defect concentration in functional materials can provide new insights that may lead to engineered grain boundaries designed for specific functionalities.

  View details for DOI 10.1038/srep02680

  View details for PubMedID 24042150

• A Brain Tumor Molecular Imaging Strategy using a New Triple-Modality MRI-Photoacoustic-Raman Nanoparticle PHOTONS PLUS ULTRASOUND: IMAGING AND SENSING 2013 de la Zerda, A., Kircher, M. F., Jokerst, J. V., Zavaleta, C. L., Kempen, P. J., Mittra, E., Pitter, K., Huang, R., Campos, C., Habte, F., Sinclair, R., Brennan, C. W., Mellinghoff, I. K., Holland, E. C., Gambhir, S. S. 2013; 8581

  View details for DOI 10.1117/12.2001719

  View details for Web of Science ID 000322832800007

• In Situ Cycle-by-Cycle Flash Annealing of Atomic Layer Deposited Materials JOURNAL OF PHYSICAL CHEMISTRY C Langston, M. C., Dasgupta, N. P., Jung, H. J., Logar, M., Huang, Y., Sinclair, R., Prinz, F. B. 2012; 116 (45): 24177-24183

  View details for DOI 10.1021/jp308895e

  View details for Web of Science ID 000311190800041

• Nickel Silicide Nanowire Arrays for Anti-Reflective Electrodes in Photovoltaics ADVANCED FUNCTIONAL MATERIALS Dasgupta, N. P., Xu, S., Jung, H. J., Iancu, A., Fasching, R., Sinclair, R., Prinz, F. B. 2012; 22 (17): 3650-3657

  View details for DOI 10.1002/adfm.201200398

  View details for Web of Science ID 000308329800015

• Shape Matters: Intravital Microscopy Reveals Surprising Geometrical Dependence for Nanoparticles in Tumor Models of Extravasation NANO LETTERS Smith, B. R., Kempen, P., Bouley, D., Xu, A., Liu, Z., Melosh, N., Dai, H., Sinclair, R., Gambhir, S. S. 2012; 12 (7): 3369-3377

  Abstract

  Delivery is one of the most critical obstacles confronting nanoparticle use in cancer diagnosis and therapy. For most oncological applications, nanoparticles must extravasate in order to reach tumor cells and perform their designated task. However, little understanding exists regarding the effect of nanoparticle shape on extravasation. Herein we use real-time intravital microscopic imaging to meticulously examine how two different nanoparticles behave across three different murine tumor models. The study quantitatively demonstrates that high-aspect ratio single-walled carbon nanotubes (SWNTs) display extravasational behavior surprisingly different from, and counterintuitive to, spherical nanoparticles although the nanoparticles have similar surface coatings, area, and charge. This work quantitatively indicates that nanoscale extravasational competence is highly dependent on nanoparticle geometry and is heterogeneous.

  View details for DOI 10.1021/nl204175t

  View details for Web of Science ID 000306296200004

  View details for PubMedID 22650417

• Smart-cut layer transfer of single-crystal SiC using spin-on-glass JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B Lee, J., Bargatin, I., Park, J., Milaninia, K. M., Theogarajan, L. S., Sinclair, R., Howe, R. T. 2012; 30 (4)

  View details for DOI 10.1116/1.4734006

  View details for Web of Science ID 000306750700046

• Photoacoustic Imaging of Mesenchymal Stem Cells in Living Mice via Silica-Coated Gold Nanorods ACS NANO Jokerst, J. V., Thangaraj, M., Kempen, P. J., Sinclair, R., Gambhir, S. S. 2012; 6 (7): 5920-5930

  Abstract

  Improved imaging modalities are critically needed for optimizing stem cell therapy. Techniques with real-time content to guide and quantitate cell implantation are especially important in applications such as musculoskeletal regenerative medicine. Here, we report the use of silica-coated gold nanorods as a contrast agent for photoacoustic imaging and quantitation of mesenchymal stem cells in rodent muscle tissue. The silica coating increased the uptake of gold into the cell more than 5-fold, yet no toxicity or proliferation changes were observed in cells loaded with this contrast agent. Pluripotency of the cells was retained, and secretome analysis indicated that only IL-6 was disregulated more than 2-fold from a pool of 26 cytokines. The low background of the technique allowed imaging of down to 100,000 cells in vivo. The spatial resolution is 340 ?m, and the temporal resolution is 0.2 s, which is at least an order of magnitude below existing cell imaging approaches. This approach has significant advantages over traditional cell imaging techniques like positron emission tomography and magnetic resonance imaging including real time monitoring of stem cell therapy.

  View details for DOI 10.1021/nn302042y

  View details for Web of Science ID 000306673800020

  View details for PubMedID 22681633

• A brain tumor molecular imaging strategy using a new triple-modality MRI-photoacoustic-Raman nanoparticle NATURE MEDICINE Kircher, M. F., de la Zerda, A., Jokerst, J. V., Zavaleta, C. L., Kempen, P. J., Mittra, E., Pitter, K., Huang, R., Campos, C., Habte, F., Sinclair, R., Brennan, C. W., Mellinghoff, I. K., Holland, E. C., Gambhir, S. S. 2012; 18 (5): 829-U235

  Abstract

  The difficulty in delineating brain tumor margins is a major obstacle in the path toward better outcomes for patients with brain tumors. Current imaging methods are often limited by inadequate sensitivity, specificity and spatial resolution. Here we show that a unique triple-modality magnetic resonance imaging-photoacoustic imaging-Raman imaging nanoparticle (termed here MPR nanoparticle) can accurately help delineate the margins of brain tumors in living mice both preoperatively and intraoperatively. The MPRs were detected by all three modalities with at least a picomolar sensitivity both in vitro and in living mice. Intravenous injection of MPRs into glioblastoma-bearing mice led to MPR accumulation and retention by the tumors, with no MPR accumulation in the surrounding healthy tissue, allowing for a noninvasive tumor delineation using all three modalities through the intact skull. Raman imaging allowed for guidance of intraoperative tumor resection, and a histological correlation validated that Raman imaging was accurately delineating the brain tumor margins. This new triple-modality-nanoparticle approach has promise for enabling more accurate brain tumor imaging and resection.

  View details for DOI 10.1038/nm.2721

  View details for Web of Science ID 000303763500053

  View details for PubMedID 22504484

• Aberration-Corrected Transmission Electron Microscopy of the Intergranular Phase in Magnetic Recording Media NANO LETTERS Hossein-Babaei, F., Koh, A. L., Srinivasan, K., Bertero, G. A., Sinclair, R. 2012; 12 (5): 2595-2598

  Abstract

  In perpendicular hard disk memory media, nanometric magnetic Co-rich grains are separated by a ?1 nm thick nonmagnetic and preferably amorphous intergranular phase (IP). Attempts at observing the IP structure at high resolution using TEM have been obstructed by the superposition of lattice fringes from the crystalline grains extending into the IP region in images. Here we present the first images of a magnetic recording medium produced using a spherical aberration-corrected TEM showing the true amorphous IP structure in contrast to the crystalline grains, allowing the accurate determination of the grain-IP interface and the grain and IP dimensions. It is shown that these aberration-corrected TEM images are functionally superior for analyzing certain features of the ultrahigh capacity data recording media.

  View details for DOI 10.1021/nl301274x

  View details for Web of Science ID 000303696400073

  View details for PubMedID 22519694

• Oxygen Surface Exchange at Grain Boundaries of Oxide Ion Conductors ADVANCED FUNCTIONAL MATERIALS Lee, W., Jung, H. J., Lee, M. H., Kim, Y., Park, J. S., Sinclair, R., Prinz, F. B. 2012; 22 (5): 965-971

  View details for DOI 10.1002/adfm.201101996

  View details for Web of Science ID 000300931500008

• Interfacial Alloy Hydride Destabilization in Mg/Pd Thin Films PHYSICAL REVIEW LETTERS Chung, C., Lee, S., Groves, J. R., Brower, E. N., Sinclair, R., Clemens, B. M. 2012; 108 (10)

  Abstract

  Recently, a large increase in the equilibrium hydrogen pressure has been reported for MG thin films capped with a Pd layer. We show that this increase is due to intermixing of Mg and Pd, as opposed to a strain effect as previously claimed. Transmission electron microscopy and depth profiling x-ray photoemission spectroscopy are used to directly measure interfacial intermixing between Mg and Pd, and we find that intermixing and equilibrium hydrogen pressure both increase with annealing. We present a thermodynamic model of the effect of alloying on equilibrium pressure, and find that the observed equilibrium pressure increase is consistent with the observed thickness of the intermixed region, which is of the order of a few nm. We also show that stress measured during hydrogenation corresponds to a negligible increase in equilibrium pressure.

  View details for DOI 10.1103/PhysRevLett.108.106102

  View details for Web of Science ID 000301101200008

  View details for PubMedID 22463426

• Effects of thermal cycling on microstructure and properties in Nitinol MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING Pelton, A. R., Huang, G. H., Moine, P., Sinclair, R. 2012; 532: 130-138

  View details for DOI 10.1016/j.msea.2011.10.073

  View details for Web of Science ID 000301160100020

• A Brain Tumor Molecular Imaging Strategy Using a Novel Triple Modality Nanoparticle Nature Medicine Kircher, M., F., Zerda, A., De La, Jokerst, J., V., Zavaleta, C., L., Kempen, P., J., Mittra, E.S., Sinclair, R. 2012; 18: 829-834
• Aberration Corrected Transmission Electron Microscopy of the Intergranular Phase in Magnetic Recording Media Nano Lett.  Hossein-Babaei, F., Koh, A., L., Srinivasan, K., Bertero, G., A., Sinclair, R. 2012; 5 (12): 2595–2598
• Effect of crystallinity on proton conductivity in yttrium-doped barium zirconate thin films SOLID STATE IONICS Kim, Y. B., Guer, T. M., Jung, H., Kang, S., Sinclair, R., Prinz, F. B. 2011; 198 (1): 39-46

  View details for DOI 10.1016/j.ssi.2011.07.004

  View details for Web of Science ID 000295892700007

• Scanning Transmission Electron Microscopy Analysis of Grain Structure in Perpendicular Magnetic Recording Media NANO LETTERS Hossein-Babaei, F., Sinclair, R. A., Srinivasan, K., Bertero, G. A. 2011; 11 (9): 3751-3754

  Abstract

  The key component of a hard disk medium is a Co-based magnetic layer (ML) grown on a Ru seed layer. The ML nanostructure, composed of less than 10 nm grains, is believed to be controlled by this seed layer. We successfully used scanning transmission electron microscopy energy dispersive spectrometry simultaneous composition-based imaging and Moire? pattern analysis for determining the mutual structural and orientation relationship between the two layers revealing a grain-to-grain agreement. The method presented here can be utilized for observing structural correlations between consecutive polycrystalline thin film layers in general.

  View details for DOI 10.1021/nl201784z

  View details for Web of Science ID 000294790200041

  View details for PubMedID 21806054

• Preclinical Evaluation of Raman Nanoparticle Biodistribution for their Potential Use in Clinical Endoscopy Imaging SMALL Zavaleta, C. L., Hartman, K. B., Miao, Z., James, M. L., Kempen, P., Thakor, A. S., Nielsen, C. H., Sinclair, R., Cheng, Z., Gambhir, S. S. 2011; 7 (15): 2232-2240

  Abstract

  Raman imaging offers unsurpassed sensitivity and multiplexing capabilities. However, its limited depth of light penetration makes direct clinical translation challenging. Therefore, a more suitable way to harness its attributes in a clinical setting would be to couple Raman spectroscopy with endoscopy. The use of an accessory Raman endoscope in conjunction with topically administered tumor-targeting Raman nanoparticles during a routine colonoscopy could offer a new way to sensitively detect dysplastic lesions while circumventing Raman's limited depth of penetration and avoiding systemic toxicity. In this study, the natural biodistribution of gold surface-enhanced Raman scattering (SERS) nanoparticles is evaluated by radiolabeling them with (64) Cu and imaging their localization over time using micropositron emission tomography (PET). Mice are injected either intravenously (IV) or intrarectally (IR) with approximately 100 microcuries (?Ci) (3.7 megabecquerel (MBq)) of (64) Cu-SERS nanoparticles and imaged with microPET at various time points post injection. Quantitative biodistribution data are obtained as % injected dose per gram (%ID g(-1)) from each organ, and the results correlate well with the corresponding microPET images, revealing that IV-injected mice have significantly higher uptake (p < 0.05) in the liver (5 h = 8.96% ID g(-1); 24 h = 8.27% ID g(-1)) than IR-injected mice (5 h = 0.09% ID g(-1); 24 h = 0.08% ID g(-1)). IR-injected mice show localized uptake in the large intestine (5 h = 10.37% ID g(-1); 24 h = 0.42% ID g(-1)) with minimal uptake in other organs. Raman imaging of excised tissues correlate well with biodistribution data. These results suggest that the topical application of SERS nanoparticles in the mouse colon appears to minimize their systemic distribution, thus avoiding potential toxicity and supporting the clinical translation of Raman spectroscopy as an endoscopic imaging tool.

  View details for DOI 10.1002/smll.201002317

  View details for Web of Science ID 000294361200015

  View details for PubMedID 21608124

• Fabrication of planar, layered nanoparticles using tri-layer resist templates NANOTECHNOLOGY Hu, W., Zhang, M., Wilson, R. J., Koh, A. L., Wi, J., Tang, M., Sinclair, R., Wang, S. X. 2011; 22 (18)

  Abstract

  A simple and universal pathway to produce free multilayer synthetic nanoparticles is developed based on lithography, vapor phase deposition and a tri-layer resist lift-off and release process. The fabrication method presented in this work is ideal for production of a broad range of nanoparticles, either free in solution or still attached to an intact release layer, with unique magnetic, optical, radioactive, electronic and catalytic properties. Multi-modal capabilities are implicit in the layered architecture. As an example, directly fabricated magnetic nanoparticles are evaluated to illustrate the structural integrity of thin internal multilayers and the nanoparticle stability in aggressive biological environments, which is highly desired for biomedical applications.

  View details for DOI 10.1088/0957-4484/22/18/185302

  View details for Web of Science ID 000288653300005

  View details for PubMedID 21415483

• Crater patterned 3-D proton conducting ceramic fuel cell architecture with ultra thin Y:BaZrO3 electrolyte ELECTROCHEMISTRY COMMUNICATIONS Kim, Y. B., Guer, T. M., Kang, S., Jung, H., Sinclair, R., Prinz, F. B. 2011; 13 (5): 403-406

  View details for DOI 10.1016/j.elecom.2011.02.004

  View details for Web of Science ID 000290741500006

• The Fate and Toxicity of Raman-Active Silica-Gold Nanoparticles in Mice SCIENCE TRANSLATIONAL MEDICINE Thakor, A. S., Luong, R., Paulmurugan, R., Lin, F. I., Kempen, P., Zavaleta, C., Chu, P., Massoud, T. F., Sinclair, R., Gambhir, S. S. 2011; 3 (79)

  Abstract

  Raman spectroscopy is an optical imaging method that is based on the Raman effect, the inelastic scattering of a photon when energy is absorbed from light by a surface. Although Raman spectroscopy is widely used for chemical and molecular analysis, its clinical application has been hindered by the inherently weak nature of the Raman effect. Raman-silica-gold-nanoparticles (R-Si-Au-NPs) overcome this limitation by producing larger Raman signals through surface-enhanced Raman scattering. Because we are developing these particles for use as targeted molecular imaging agents, we examined the acute toxicity and biodistribution of core polyethylene glycol (PEG)-ylated R-Si-Au-NPs after different routes of administration in mice. After intravenous administration, PEG-R-Si-Au-NPs were removed from the circulation by macrophages in the liver and spleen (that is, the reticuloendothelial system). At 24 hours, PEG-R-Si-Au-NPs elicited a mild inflammatory response and an increase in oxidative stress in the liver, which subsided by 2 weeks after administration. No evidence of significant toxicity was observed by measuring clinical, histological, biochemical, or cardiovascular parameters for 2 weeks. Because we are designing targeted PEG-R-Si-Au-NPs (for example, PEG-R-Si-Au-NPs labeled with an affibody that binds specifically to the epidermal growth factor receptor) to detect colorectal cancer after administration into the bowel lumen, we tested the toxicity of the core nanoparticle after administration per rectum. We observed no significant bowel or systemic toxicity, and no PEG-R-Si-Au-NPs were detected systemically. Although additional studies are required to investigate the long-term effects of PEG-R-Si-Au-NPs and their toxicity when carrying the targeting moiety, the results presented here support the idea that PEG-R-Si-Au-NPs can be safely used in living subjects, especially when administered rectally.

  View details for DOI 10.1126/scitranslmed.3001963

  View details for Web of Science ID 000292976700004

  View details for PubMedID 21508310

• Thermal conductivity anisotropy and grain structure in Ge2Sb2Te5 films JOURNAL OF APPLIED PHYSICS Lee, J., Li, Z., Reifenberg, J. P., Lee, S., Sinclair, R., Asheghi, M., Goodson, K. E. 2011; 109 (8)

  View details for DOI 10.1063/1.3573505

  View details for Web of Science ID 000290047000229

• Atomic Layer Deposition of Lead Sulfide Quantum Dots on Nanowire Surfaces NANO LETTERS Dasgupta, N. P., Jung, H. J., Trejo, O., McDowell, M. T., Hryciw, A., Brongersma, M., Sinclair, R., Prinz, F. B. 2011; 11 (3): 934-940

  Abstract

  Quantum dots provide unique advantages in the design of novel optoelectronic devices owing to the ability to tune their properties as a function of size. Here we demonstrate a new technique for fabrication of quantum dots during the nucleation stage of atomic layer deposition (ALD) of PbS. Islands with sub-10 nm diameters were observed during the initial ALD cycles by transmission electron microscopy, and in situ observations of the coalescence and sublimation behavior of these islands show the possibility of further modifying the size and density of dots by annealing. The ALD process can be used to cover high-aspect-ratio nanostructures, as demonstrated by the uniform coating of a Si nanowire array with a single layer of PbS quantum dots. Photoluminescence measurements on the quantum dot/nanowire composites show a blue shift when the number of ALD cycles is decreased, suggesting a route to fabricate unique three-dimensional nanostructured devices such as solar cells.

  View details for DOI 10.1021/nl103001h

  View details for Web of Science ID 000288061500003

  View details for PubMedID 21319844

• Oxidative Stress Mediates the Effects of Raman-Active Gold Nanoparticles in Human Cells SMALL Thakor, A. S., Paulmurugan, R., Kempen, P., Zavaleta, C., Sinclair, R., Massoud, T. F., Gambhir, S. S. 2011; 7 (1): 126-136

  Abstract

  Polyethylene glycol (PEG)ylated Raman-active gold nanoparticles (PEG-R-AuNPs) consist of an interchangeable Raman organic molecule layer held onto a gold nanocore by a silica shell. PEG-R-AuNPs have been shown preclinically to increase the sensitivity and specificity of Raman spectroscopy, with picomolar sensitivity and multiplexing capabilities. Although clinical trials are being designed to use functionalized PEG-R-AuNPs in various applications (e.g., to target dysplastic bowel lesions during colonoscopy), the effects of these nanoparticles on human cells remain unknown. The occurrence and mechanisms underlying any potential cytotoxicity induced by these nanoparticles (0-1000 PEG-R-AuNPs/cell) are investigated in immortalized human HeLa and HepG2 cell lines at several time points (0-48 h) after exposure. Using fluorometric assays, cell viability (MTT), reactive oxygen species (ROS) generation (dichlorofluorescein diacetate), protein oxidation (protein carbonyl content), and total cellular antioxidant concentrations the concentrations (metmyoblobin-induced oxidation of ABTS) are assessed. Analysis of lipid oxidation using an enzyme immunoassay (8-isoprostane concentrations), gene expression of antioxidant enzymes using quantitative reverse transcription polymerase chain reactions, and the intracellular location of PEG-R-AuNPs using transmission electron microscopy is also undertaken. PEG-R-AuNPs cause no cytotoxicity in either HeLa or HepG2 cells in the acute setting as ROS generation is balanced by antioxidant enzyme upregulation. Following prolonged exposures (48 h) at relatively high concentrations (1000 PEG-R-AuNPs/cell), nanoparticles are found within vesicles inside cells. Under these conditions, a minimal amount of cytotoxicity is seen in both cell lines owing to increases in cellular oxidative stress, most likely due to ROS overwhelming the antioxidant defenses. Evidence of oxidative stress-induced damage includes increased lipid and protein oxidation. Although further in vivo toxicity studies are necessary, these initial encouraging results show that PEG-R-AuNPs cause minimal toxicity in human cells in the acute setting, which bodes well for potential future applications of these nanoparticles in living subjects.

  View details for DOI 10.1002/smll.201001466

  View details for Web of Science ID 000285794100015

  View details for PubMedID 21104804

• Atomic layer deposition of CdxZn1-xS films JOURNAL OF MATERIALS CHEMISTRY Bakke, J. R., Tanskanen, J. T., Jung, H. J., Sinclair, R., Bent, S. F. 2011; 21 (3): 743-751

  View details for DOI 10.1039/c0jm02786c

  View details for Web of Science ID 000285749900021

• Scanning Electron Microscopy and Surface Enhanced Raman Spectroscopy Correlation Studies of Functionalized Composite Organic-Inorganic SERS Nanoparticles on Cancer Cells Koh, A., L., Sinclair, R. 2011

  View details for DOI 10.1557/opi.2011.664.

• Oxidative Stress Mediates the Effets of Raman Active Gold Nanoparticles in Human Cells Small Thakor, A., S., Paulmurugan, R., Kempen, P., J., Zavaleta, C., L., Sinclair, R., Massoud, T., F. 2011; 7: 126–136
• Crater Patterned 3-D Protonic Fuel Cell with Ultra Thin Y:BaZrO3 Ceramic Membrane Electrochem. Comm. Kim, Y., B., Gur, T., M., Kang, S., Jung, H., J., Sinclair, R., Prinz, F., B. 2011; 5 (13): 403-406

  View details for DOI 10.1016/j.elecom.2011.02.004.

• Correlative Microscopy of Tumor Vasculature Kempen, P., J., Smith, B., R., Kircher, M., F., Gambhir, S., S., Sinclair, R. 2011
• The Fate and Toxicity of Raman Active Silica-Gold Nanoparticles in Mice Sci Transl Med Thakor, A., S., Luong, R., Murugan, R., Lin, F., Kempen, P., J., Zavaleta, C., L., Sinclair, R. 2011; 3: 79ra33
• Effect of crystallinity on ionic conductivity of Y-doped Barium Zirconate Solid State Ionics Kim, Y., B., Gur, T., M., Jung, H., J., Kang, S., Sinclair, R., Prinz, F., B. 2011; 198 (1, 19): 39-46
• Proton Conduction in Epitaxial and Polycrystalline Yttrium-doped Barium Zirconate Thin Films Kim, Y., B., Gür, T., M., Jung, H., J., Kang, S., Prinz, F., B. 2011
• Scanning tunneling spectroscopy of lead sulfide quantum wells fabricated by atomic layer deposition NANOTECHNOLOGY Lee, W., Dasgupta, N. P., Jung, H. J., Lee, J., Sinclair, R., Prinz, F. B. 2010; 21 (48)

  Abstract

  We report the use of scanning tunneling spectroscopy (STS) to investigate one-dimensional quantum confinement effects in lead sulfide (PbS) thin films. Specifically, quantum confinement effects on the band gap of PbS quantum wells were explored by controlling the PbS film thickness and potential barrier height. PbS quantum well structures with a thickness range of 1-20 nm were fabricated by atomic layer deposition (ALD). Two barrier materials were selected based on barrier height: aluminum oxide as a high barrier material and zinc oxide as a low barrier material. Band gap measurements were carried out by STS, and an effective mass theory was developed to compare the experimental results. Our results show that the band gap of PbS thin films increased as the film thickness decreased, and the barrier height increased from 0.45 to 2.19 eV.

  View details for DOI 10.1088/0957-4484/21/48/485402

  View details for Web of Science ID 000284053500011

  View details for PubMedID 21063050

• Laser-Synthesized Epitaxial Graphene ACS NANO Lee, S., Toney, M. F., Ko, W., Randel, J. C., Jung, H. J., Munakata, K., Lu, J., Geballe, T. H., Beasley, M. R., Sinclair, R., Manoharan, H. C., Salleo, A. 2010; 4 (12): 7524-7530

  Abstract

  Owing to its unique electronic properties, graphene has recently attracted wide attention in both the condensed matter physics and microelectronic device communities. Despite intense interest in this material, an industrially scalable graphene synthesis process remains elusive. Here, we demonstrate a high-throughput, low-temperature, spatially controlled and scalable epitaxial graphene (EG) synthesis technique based on laser-induced surface decomposition of the Si-rich face of a SiC single-crystal. We confirm the formation of EG on SiC as a result of excimer laser irradiation by using reflection high-energy electron diffraction (RHEED), Raman spectroscopy, synchrotron-based X-ray diffraction, transmission electron microscopy (TEM), and scanning tunneling microscopy (STM). Laser fluence controls the thickness of the graphene film down to a single monolayer. Laser-synthesized graphene does not display some of the structural characteristics observed in EG grown by conventional thermal decomposition on SiC (0001), such as Bernal stacking and surface reconstruction of the underlying SiC surface.

  View details for DOI 10.1021/nn101796e

  View details for Web of Science ID 000285449100060

  View details for PubMedID 21121692

• Atomic Layer Deposition of CdS Films CHEMISTRY OF MATERIALS Bakke, J. R., Jung, H. J., Tanskanen, J. T., Sinclair, R., Bent, S. F. 2010; 22 (16): 4669-4678

  View details for DOI 10.1021/cm100874f

  View details for Web of Science ID 000280855100021

• Atomic layer deposition of ZnS via in situ production of H2S THIN SOLID FILMS BAKKE, J. R., King, J. S., Jung, H. J., Sinclair, R., Bent, S. F. 2010; 518 (19): 5400-5408

  View details for DOI 10.1016/j.tsf.2010.03.074

  View details for Web of Science ID 000279885700009

• Structural and magnetic characterizations of high moment synthetic antiferromagnetic nanoparticles fabricated using self-assembled stamps Koh, A. L., Hu, W., Wilson, R. J., Earhart, C. M., Wang, S. X., Sinclair, R. AMER INST PHYSICS. 2010

  View details for DOI 10.1063/1.3358067

  View details for Web of Science ID 000277834300225

• Utilizing Scanning Transmission Electron Microscopy to Locate and Image Raman Active Gold Core Nanoparticles in Mouse Tissue Kempen, P., J., Thakor, A., S., Zavaleta, C., L., Gambhir, S., S., Sinclair, R. 2010
• TEM Study on PbS Quantum Dots Made by Atomic Layer Deposition and Their Behavior Under E-beam Irradiation Jung, H., J., Dasgupta, N., P., Prinz, F., B., Sinclair, R. 2010
• Utilizing Scanning Transmission Electron Microscopy to Locate and Image Raman Active Gold Core Nanoparticles in Mouse Tissue Kempen, P., J., Thakor, A., S., Zavaleta, C., L., Gambhir, S., S., Sinclair, R. 2010
• Nanostructural correlation between Co magnetic layer and its Ru seed layer in a PMR medium Hossein-Babaei (Jr.), F., Sinclair, R., Bertero, G., Srinivasan, K. 2010
• Structural and Magnetic Characterization of High Moment Synthetic Antiferromagnetic Nanoparticles Fabricated Using Self-Assembled Stamps J. Appl Phys. Koh, A., L., Hu, W., Wilson, R., J., Earhart, C., M., Wang, S., X., Sinclair, R. 2010; 107: 09B522 1-3
• Organic-Inorganic Particles as Labels to Trace Biological Signaling Pathways Koh, A., L., Sinclair, R. 2010

  View details for DOI 10.1017/S143192761005899X.

• Developing Remote Microscopy at a University User Facility Chin, R., Sinclair, R. 2010
• Electron Energy-Loss Spectrometry (EELS) and Energy-Filtered TEM (EFTEM) Analyses of Organic-Inorganic Nanoparticles Koh, A. L., Watanabe, M., Sinclair, R. CAMBRIDGE UNIV PRESS. 2009: 432-433

  View details for DOI 10.1017/S1431927609092964

  View details for Web of Science ID 000208119100214

• In Situ and High Resolution TEM Studies of Nano-scale Materials Sinclair, R., Koh, A. L., Kempen, P. J., Jung, H. J. CAMBRIDGE UNIV PRESS. 2009: 1200-1201

  View details for DOI 10.1017/S1431927609097554

  View details for Web of Science ID 000208119100591

• Formation and properties of magnetic chains for 100nm nanoparticles used in separations of molecules and cells Wilson, R. J., Hu, W., Fu, C. W., Koh, A. L., Gaster, R. S., Earhart, C. M., Fu, A., Heilshorn, S. C., Sinclair, R., Wang, S. X. ELSEVIER SCIENCE BV. 2009: 1452-1458

  Abstract

  Optical observations of 100 nm metallic magnetic nanoparticles are used to study their magnetic field induced self assembly. Chains with lengths of tens of microns are observed to form within minutes at nanoparticle concentrations of 10(10) per mL. Chain rotation and magnetophoresis are readily observed, and SEM reveals that long chains are not simple single particle filaments. Similar chains are detected for several 100 nm commercial bio-separation nanoparticles. We demonstrate the staged magnetic condensation of different types of nanoparticles into composite structures and show that magnetic chains bind to immunomagnetically labeled cells, serving as temporary handles which allow novel magnetic cell manipulations.

  View details for DOI 10.1016/j.jmmm.2009.02.066

  View details for Web of Science ID 000265278000028

  View details for PubMedID 20161001

• A Novel Method for Detection of Phosphorylation in Single Cells by Surface Enhanced Raman Scattering (SERS) using Composite Organic-Inorganic Nanoparticles (COINs) PLOS ONE Shachaf, C. M., Elchuri, S. V., Koh, A. L., Zhu, J., Nguyen, L. N., Mitchell, D. J., Zhang, J., Swartz, K. B., Sun, L., Chan, S., Sinclair, R., Nolan, G. P. 2009; 4 (4)

  Abstract

  Detection of single cell epitopes has been a mainstay of immunophenotyping for over three decades, primarily using fluorescence techniques for quantitation. Fluorescence has broad overlapping spectra, limiting multiplexing abilities.To expand upon current detection systems, we developed a novel method for multi-color immuno-detection in single cells using "Composite Organic-Inorganic Nanoparticles" (COINs) Raman nanoparticles. COINs are Surface-Enhanced Raman Scattering (SERS) nanoparticles, with unique Raman spectra. To measure Raman spectra in single cells, we constructed an automated, compact, low noise and sensitive Raman microscopy device (Integrated Raman BioAnalyzer). Using this technology, we detected proteins expressed on the surface in single cells that distinguish T-cells among human blood cells. Finally, we measured intracellular phosphorylation of Stat1 (Y701) and Stat6 (Y641), with results comparable to flow cytometry.Thus, we have demonstrated the practicality of applying COIN nanoparticles for measuring intracellular phosphorylation, offering new possibilities to expand on the current fluorescent technology used for immunoassays in single cells.

  View details for DOI 10.1371/journal.pone.0005206

  View details for Web of Science ID 000265510400006

  View details for PubMedID 19367337

• Synthetic antiferromagnetic nanoparticles with tunable susceptibilities Hu, W., Wilson, R. J., Earhart, C. M., Koh, A. L., Sinclair, R., Wang, S. X. AMER INST PHYSICS. 2009

  View details for DOI 10.1063/1.3072028

  View details for Web of Science ID 000266633500313

• "NO TITAN, NO EXCUSE" (T. J. KONNO, 1 APRIL 2008) A REPORT ON AN INTERNATIONAL WORKSHOP ON REMOTE ELECTRON MICROSCOPY FOR IN SITU STUDIES ACTA MICROSCOPICA Sinclair, R., Chin, R., Koh, A. L., Solorzano, G. 2009; 18 (1): 33-38

  View details for Web of Science ID 000276809600004

• No Titan, No Excuse’ (T.J. Konno, 1 April 2008) A Report on an International Workshop on Remote Electron Microscopy for In Situ Studies Acta Microscopica Sinclair, R., Chin, R., Koh, A., L., Solorzano, G. 2009; 1 (18): 33–38
• Direct Microscale Visualization of Targeted Quantum Dot Binding in Multiple Tumor Models of Living Mice using Intravital Microscopy Smith, B., Cheng, Z., Zerda, A., de la, Koh, A., L., Sinclair, R. 2009
• Formation and properties of magnetic chains for 100 nm nanoparticles used in separations of molecules and cells J. Magn. Magn. Mat. Wilson, R.J., Hu, W., Wong, C., P.F., Koh, A., L., Gaster, R., Earhart, C., M., Sinclair, R. 2009; 321: 1452–1458
• Electron Microscopy Characterization of Gold-Silica Core-Shell Nanoparticle Raman Labels (Nanoplex™ Biotags) and their Conjugation to Cells Kempen, P., J., Koh, A., L., Zavaleta, C., Hartman, K., Gambhir, S., Sinclair, R. 2009
• Particle Size, Surface Coating, and PEGylation Influence the Biodistribution of Quantum Dots in Living Mice SMALL Schipper, M. L., Iyer, G., Koh, A. L., Cheng, Z., Ebenstein, Y., Aharoni, A., Keren, S., Bentolila, L. A., Li, J., Rao, J., Chen, X., Banin, U., Wu, A. M., Sinclair, R., Weiss, S., Gambhir, S. S. 2009; 5 (1): 126-134

  Abstract

  This study evaluates the influence of particle size, PEGylation, and surface coating on the quantitative biodistribution of near-infrared-emitting quantum dots (QDs) in mice. Polymer- or peptide-coated 64Cu-labeled QDs 2 or 12 nm in diameter, with or without polyethylene glycol (PEG) of molecular weight 2000, are studied by serial micropositron emission tomography imaging and region-of-interest analysis, as well as transmission electron microscopy and inductively coupled plasma mass spectrometry. PEGylation and peptide coating slow QD uptake into the organs of the reticuloendothelial system (RES), liver and spleen, by a factor of 6-9 and 2-3, respectively. Small particles are in part renally excreted. Peptide-coated particles are cleared from liver faster than physical decay alone would suggest. Renal excretion of small QDs and slowing of RES clearance by PEGylation or peptide surface coating are encouraging steps toward the use of modified QDs for imaging living subjects.

  View details for DOI 10.1002/smll.200800003

  View details for Web of Science ID 000262895300019

  View details for PubMedID 19051182

• Electron microscopy localization and characterization of functionalized composite organic-inorganic SERS nanoparticles on leukemia cells ULTRAMICROSCOPY Koh, A. L., Shachaf, C. M., Elchuri, S., Nolan, G. P., Sinclair, R. 2008; 109 (1): 111-121

  Abstract

  We demonstrate the use of electron microscopy as a powerful characterization tool to identify and locate antibody-conjugated composite organic-inorganic nanoparticle (COINs) surface enhanced Raman scattering (SERS) nanoparticles on cells. U937 leukemia cells labeled with antibody CD54-conjugated COINs were characterized in their native, hydrated state using wet scanning electron microscopy (SEM) and in their dehydrated state using high-resolution SEM. In both cases, the backscattered electron (BSE) detector was used to detect and identify the silver constituents in COINs due to its high sensitivity to atomic number variations within a specimen. The imaging and analytical capabilities in the SEM were further complemented by higher resolution transmission electron microscopy (TEM) images and scanning Auger electron spectroscopy (AES) data to give reliable and high-resolution information about nanoparticles and their binding to cell surface antigens.

  View details for DOI 10.1016/j.ultramic.2008.09.004

  View details for Web of Science ID 000261750500016

  View details for PubMedID 18995965

• Multiplex Detection of Protease Activity with Quantum Dot Nanosensors Prepared by Intein-Mediated Specific Bioconjugation ANALYTICAL CHEMISTRY Xia, Z., Xing, Y., So, M., Koh, A. L., Sinclair, R., Rao, J. 2008; 80 (22): 8649-8655

  Abstract

  We report here a protease sensing nanoplatform based on semiconductor nanocrystals or quantum dots (QDs) and bioluminescence resonance energy transfer (QD-BRET) to detect the protease activity in complex biological samples. These nanosensors consist of bioluminescent proteins as the BRET donor, quantum dots as the BRET acceptor, and protease substrates sandwiched between the two as a sensing group. An intein-mediated conjugation strategy was developed for site-specific conjugation of proteins to QDs in preparing these QD nanosensors. In this traceless ligation, the intein itself is spliced out and excluded from the final conjugation product. With this method, we have synthesized a series of QD nanosensors for highly sensitive detection of an important class of protease matrix metalloproteinase (MMP) activity. We demonstrated that these nanosensors can detect the MMP activity in buffers and in mouse serum with the sensitivity to a few nanograms per milliliter and secreted proteases by tumor cells. The suitability of these nanosensors for a multiplex protease assay has also been shown.

  View details for DOI 10.1021/ac801562f

  View details for Web of Science ID 000260910900039

  View details for PubMedID 18922019

• TEM analyses of synthetic anti-ferromagnetic (SAF) nanoparticles fabricated using different release layers ULTRAMICROSCOPY Koh, A. L., Hu, W., Wilson, R. J., Wang, S. X., Sinclair, R. 2008; 108 (11): 1490-1494

  Abstract

  This paper investigates the structural characteristics of templated synthetic anti-ferromagnetic (SAF) magnetic nanoparticles fabricated on two different release layers. When copper was used as the latter, the layered structure of the SAFs was found to be disrupted with wavy multi-layers due to the formation of copper grains from the release layer. By introducing oxygen into the copper release layer before the deposition of the film, the topography of the oxidized copper grains was effectively controlled. This led to the fabrication of SAF nanoparticles with flat multi-layers.

  View details for DOI 10.1016/j.ultramic.2008.03.012

  View details for Web of Science ID 000260518200014

  View details for PubMedID 18672328

• Real-time intravital imaging of RGD-quantum dot binding to luminal endothelium in mouse tumor neovasculature NANO LETTERS Smith, B. R., Cheng, Z., De, A., Koh, A. L., Sinclair, R., Gambhir, S. S. 2008; 8 (9): 2599-2606

  Abstract

  Nanoscale materials have increasingly become subject to intense investigation for use in cancer diagnosis and therapy. However, there is a fundamental dearth in cellular-level understanding of how nanoparticles interact within the tumor environment in living subjects. Adopting quantum dots (qdots) for their excellent brightness, photostability, monodispersity, and fluorescent yield, we link arginine-glycine-aspartic acid (RGD) peptides to target qdots specifically to newly formed/forming blood vessels expressing alpha vbeta 3 integrins. Using this model nanoparticle system, we exploit intravital microscopy with subcellular ( approximately 0.5 microm) resolution to directly observe and record, for the first time, the binding of nanoparticle conjugates to tumor blood vessels in living subjects. This generalizable method enabled us to show that in this model qdots do not extravasate and, unexpectedly, that they only bind as aggregates rather than individually. This level of understanding is critical on the path toward ensuring regulatory approval of nanoparticles in humans for disease diagnostics and therapeutics. Equally vital, the work provides a platform by which to design and optimize molecularly targeted nanoparticles including quantum dots for applications in living subjects.

  View details for DOI 10.1021/nl80141f

  View details for Web of Science ID 000259140200001

  View details for PubMedID 18386933

• Improved QD-BRET conjugates for detection and imaging BIOCHEMICAL AND BIOPHYSICAL RESEARCH COMMUNICATIONS Xing, Y., So, M., Koh, A. L., Sinclair, R., Rao, J. 2008; 372 (3): 388-394

  Abstract

  Self-illuminating quantum dots, also known as QD-BRET conjugates, are a new class of quantum dot bioconjugates which do not need external light for excitation. Instead, light emission relies on the bioluminescence resonance energy transfer from the attached Renilla luciferase enzyme, which emits light upon the oxidation of its substrate. QD-BRET combines the advantages of the QDs (such as superior brightness and photostability, tunable emission, multiplexing) as well as the high sensitivity of bioluminescence imaging, thus holding the promise for improved deep tissue in vivo imaging. Although studies have demonstrated the superior sensitivity and deep tissue imaging potential, the stability of the QD-BRET conjugates in biological environment needs to be improved for long-term imaging studies such as in vivo cell tracking. In this study, we seek to improve the stability of QD-BRET probes through polymeric encapsulation with a polyacrylamide gel. Results show that encapsulation caused some activity loss, but significantly improved both the in vitro serum stability and in vivo stability when subcutaneously injected into the animal. Stable QD-BRET probes should further facilitate their applications for both in vitro testing as well as in vivo cell tracking studies.

  View details for DOI 10.1016/j.bbrc.2008.04.159

  View details for Web of Science ID 000256941300002

  View details for PubMedID 18468518

• Synthesis and characterization of PVP-coated large core iron oxide nanoparticles as an MRI contrast agent NANOTECHNOLOGY Lee, H., Lee, S., Xu, C., Xie, J., Lee, J., Wu, B., Koh, A. L., Wang, X., Sinclair, R., Xwang, S., Nishimura, D. G., Biswal, S., Sun, S., Cho, S. H., Chen, X. 2008; 19 (16)

  View details for DOI 10.1088/0957-4484/19/16/165101

  View details for Web of Science ID 000254174800001

• High-moment antiferromagnetic nanoparticles with tunable magnetic properties ADVANCED MATERIALS Hu, W., Wilson, R. J., Koh, A., Fu, A., Faranesh, A. Z., Earhart, C. M., Osterfeld, S. J., Han, S., Xu, L., Guccione, S., Sinclair, R., Wang, S. X. 2008; 20 (8): 1479-?

  View details for DOI 10.1002/adma.200703077

  View details for Web of Science ID 000255694200015

• Preparation, structural and magnetic characterization of synthetic anti-ferromagnetic (SAF) nanoparticles PHILOSOPHICAL MAGAZINE Koh, A. L., Hu, W., Wilson, R. J., Wang, S. X., Sinclair, R. 2008; 88 (36): 4225-4241

  View details for DOI 10.1080/14786430802585133

  View details for Web of Science ID 000261804200002

• Electron Microscopy Characterization of Composite Organic-Inorganic Nanoparticles (COINs) as Raman Labels for Extra-Cellular Analyses Microsc. Microanal. Koh, A., L., Shachaf, C., M., Elchuri, S., Nolan, G., P., Sinclair, R. 2008; 14: 670CD
• Electron Microscopy Characterization of Composite Organic-Inorganic Nanoparticles (COINs) as Raman Labels for Extra-Cellular Analyses Koh, A., L., Shachaf, C., M., Elchuri, S., Nolan, G., P., Sinclair, R. 2008
• Real-Time Intravital Imaging of RGD−Quantum Dot Binding to Luminal Endothelium in Mouse Tumor Neovasculature Nano Letters Smith, B., R., Cheng, Z., De, A., Koh, A., L., Sinclair, R., Gambhir, S., S. 2008; 9 (8): 2599-2606
• Analytical TEM examinations of CoPt-TiO2 perpendicular magnetic recording media MICROSCOPY AND MICROANALYSIS Risner, J. D., Nolan, T. P., Bentley, J., Girt, E., Harkness, S. D., Sinclair, R. 2007; 13 (2): 70-79

  Abstract

  For this analytical TEM study, nonmagnetic oxygen-rich boundaries were introduced into Co-Pt-alloy perpendicular recording media by cosputtering Co and Pt with TiO2. Increasing the TiO2 content resulted in changes to the microstructure and elemental distribution within grains and boundaries in these films. EFTEM imaging was used to generate composition maps spanning many tens of grains, thereby giving an overall depiction of the changes in elemental distribution occurring with increasing TiO2 content. Comparing EFTEM with spectrum-imaging maps created by high-resolution STEM with EDXS and EELS enabled both corroboration of EFTEM results and quantification of the chemical composition within individual grain boundary areas. The difficulty of interpreting data from EDXS for these extremely thin films is discussed. Increasing the TiO2 content of the media was found to create more uniformly wide Ti- and O-rich grain boundaries as well as Ti- and O-rich regions within grains.

  View details for DOI 10.1017/S14319276070213

  View details for Web of Science ID 000245662200001

  View details for PubMedID 17367546

• Orientation relationship in diamond and silicon carbide composites DIAMOND AND RELATED MATERIALS Park, J. S., Sinclair, R., Rowcliffe, D., Stern, M., Davidson, H. 2007; 16 (3): 562-565

  View details for DOI 10.1016/j.diamond.2006.11.050

  View details for Web of Science ID 000244827100024

• Microstructure and exchange coupling of segregated oxide perpendicular recording media Nolan, T. P., Risner, J. D., Harkness, S. D., Girt, E., Wu, S. Z., Ju, G., Sinclair, R. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 2007: 639-644

  View details for DOI 10.1109/TMAG.2006.888208

  View details for Web of Science ID 000244011300011

• Composition mapping of Co-Pt-Ti-O perpendicular magnetic recording media by simultaneous EDS and EELS spectrum imaging BENTLEY, J., Risner, J. D., Sinclair, R. CAMBRIDGE UNIV PRESS. 2007: 158-159

  View details for DOI 10.1017/S1431927607078385

  View details for Web of Science ID 000258691300079

• TEM Studies of Iron Oxide Nanoparticles for Cell Labeling and Magnetic Separation Koh, A., L., Sinclair, R. 2007
• Characterization of Magnetic Nanoparticles by High Resolution TEM Methods Sinclair, R., Li, H., Koh, A., L. 2007
• Grain Size Distribution in CoCrPtO-based Perpendicular Magnetic Recording Media Hossein-Babaei, F., Kwon, U., Sinclair, R. 2007
• TEM Observations of Bio-conjugated Streptavidin-Gold Particles Koh, A., L., Sinclair, R. 2007
• TEM Studies of Synthetic Anti-ferromagnetic (SAF) Nanoparticles Koh, A., L., Hu, W., Wilson, R., Wang, S., X., Sinclair, R. 2007
• Characterization of magnetic nano-particles by high resolution TEM methods Sinclair, R., Li, H., Koh, A. L. CAMBRIDGE UNIV PRESS. 2007: 66-67

  View details for DOI 10.1017/S1431927607079238

  View details for Web of Science ID 000258691300033

• Effect of magnetic recording layer thickness on media performance in CoCrPt-oxide perpendicular media IEEE TRANSACTIONS ON MAGNETICS Kwon, U., Jung, H. S., Kuo, M., Velu, E. M., Malhotra, S. S., Jiang, W., Bertero, G., Sinclair, R. 2006; 42 (10): 2330-2332

  View details for DOI 10.1109/TMAG.2006.878697

  View details for Web of Science ID 000240888700027

• FIB and TEM studies of interface structure in diamond-SiC composites Park, J. S., Sinclair, R., Rowcliffe, D., Stern, M., Davidson, H. SPRINGER. 2006: 4611-4616

  View details for DOI 10.1007/s10853-006-0249-7

  View details for Web of Science ID 000239720900026

• Observation of the effect of grain orientation on chromium segregation in longitudinal magnetic media JOURNAL OF APPLIED PHYSICS Risner, J. D., Sinclair, R., BENTLEY, J. 2006; 99 (3)

  View details for DOI 10.1063/1.2169873

  View details for Web of Science ID 000235341000048

• Information Storage Technology: The Role of the TEM Sinclair, R., Risner, J., Kwon, U. 2006
• FIB and TEM Studies of Interface Structure in Diamond-SiC Composites Park, J., S., Sinclair, R., Rowcliffe, D., Stern, M., Davidson, H. 2006
• TEM Studies of Reactions in Thin Films and their Interfaces Sinclair, R. 2006
• Characterization of AuFe-C Core-shell Nanoparticles Li, H., Dai, H., Xing, L., Sinclair, R. 2006
• Ru/Ru-oxide interlayers for CoCrPtO perpendicular recording media Kwon, U., Sinclair, R., Velu, E. M., Malhotra, S., Bertero, G. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 2005: 3193-3195

  View details for DOI 10.1109/TMAG.2005.855281

  View details for Web of Science ID 000232679700204

• High-Resolution Analytical TEM and Energy-Filtered Imaging of CoPt-Oxide Perpendicular Magnetic Recording Media. Microscopy and microanalysis Risner, J. D., Nolan, T. P., BENTLEY, J., Wu, S. Z., Iv, S. D., Sinclair, R. 2005; 11: 1806-1807

  Abstract

  Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005.

  View details for DOI 10.1017/S1431927605502186

  View details for PubMedID 24017771

• Crystallization behaviour of ALD-Ta2O5 thin films: the application of in-situ TEM PHILOSOPHICAL MAGAZINE Min, K. H., Sinclair, R., Park, I. S., Kim, S. T., Chung, U. I. 2005; 85 (18): 2049-2063

  View details for DOI 10.1080/147864305000365465

  View details for Web of Science ID 000230456100008

• Crystallization and anisotropic dielectric properties of tantalum oxide thin films JOURNAL OF CERAMIC PROCESSING RESEARCH Min, K. H., Sinclair, R. 2005; 6 (1): 17-19

  View details for Web of Science ID 000228339100003

• HRTEM and Nano-probe EDS Studies on the Microstructure of CoCrPtO Perpendicular Recording Media with Ru/Ru-oxide Interlayers Kwon, U., Sinclair, R. 2005
• High-Resolution Analytical TEM and Energy-Filtered Imaging of CoPt-Oxide Perpendicular Magnetic Recording Media Risner, J., D., Nolan, T., P., Bentley, J., Wu, S., Z., Harkness, S., D., Sinclair, R. 2005
• Application of In Situ HREM to Study Crystallization in Materials Materials Science Forum Sinclair, R., Min, K., H., Kwon, U. 2005; 494: 7-12
• Crystallization Behavior of ALD-Ta2O5 Thin Films: An Application of In-situ TEM Philos. Mag. Min, K., H., Sinclair, R., Park, I., S., Kim, S., T., Chung, U., I. 2005; 18 (85): 2049-2063
• Synthesis and Characterization of Fe-C Core-shell Nanoparticles Li, H., Dai, H., Sinclair, R. 2005
• Investigation of the chemical state of ultrathin Hf-Al-O films during high temperature annealing SURFACE SCIENCE Cho, M. H., Chang, H. S., Cho, Y. J., Moon, D. W., Min, K. H., Sinclair, R., Kang, S. K., Ko, D. H., Lee, J. H., Gu, J. H., Lee, N. I. 2004; 554 (1): L75-L80

  View details for DOI 10.1016/j.susc.2004.01.058

  View details for Web of Science ID 000220419700001

• Change in the chemical state and thermal stability of HfO2 by the incorporation of Al2O3 APPLIED PHYSICS LETTERS Cho, M. H., Chang, H. S., Cho, Y. J., Moon, D. W., Min, K. H., Sinclair, R., Kang, S. K., Ko, D. H., Lee, J. H., Gu, J. H., Lee, N. I. 2004; 84 (4): 571-573

  View details for DOI 10.1063/1.1633976

  View details for Web of Science ID 000188316500039

• Carbide evolution in temper embrittled NiCrMoV bainitic steel STEEL RESEARCH INTERNATIONAL Wittig, J. E., Sinclair, R. 2004; 75 (1): 47-54

  View details for Web of Science ID 000188261600008

• High Resolution and Analytical TEM of Cr Grain Boundary Segregation in Co-alloy Longitudinal Hard Disk Magnetic Recording Media Risner, J., Sinclair, R., Bentley, J. 2004
• Recent developments in nano-characterization of materials JOURNAL OF CERAMIC PROCESSING RESEARCH Sinclair, R., Li, H., Risner, J., Kwon, U., Huh, J. U., Chin, R. W., Min, K. H. 2004; 5 (1): 5-9

  View details for Web of Science ID 000220751400002

• Thermal stability of epitaxial Pt films on Y2O3 in a metal-oxide-Si structure APPLIED PHYSICS LETTERS Cho, M. H., Moon, D. W., Min, K. H., Sinclair, R., Park, S. A., Kim, Y. K., Jeong, K., Kang, S. K., Ko, D. H. 2003; 83 (23): 4758-4760

  View details for DOI 10.1063/1.1632541

  View details for Web of Science ID 000186970200024

• Transmission electron microscopy analysis of computer hard disc, magnetic thin films Risner, J., Kwon, U., Park, D. W., Sinclair, R. ELSEVIER SCIENCE SA. 2003: 241-243

  View details for DOI 10.1016/S0254-0584(02)00559-X

  View details for Web of Science ID 000184572200012

• Characterization for crystallization of SrBi2Nb2O9 thin films on Si substrates Yoo, D. C., Lee, J. Y., Sinclair, R., Kim, I. S., Kim, Y. T. KOREAN PHYSICAL SOC. 2003: S450-S453

  View details for Web of Science ID 000181337500084

• The effects of slider material on the gasification of carbon JOURNAL OF TRIBOLOGY-TRANSACTIONS OF THE ASME Ramirez, A. G., Sinclair, R., Harkins, C. G., Lin, A. R. 2002; 124 (4): 771-774

  View details for DOI 10.1115/1.1467613

  View details for Web of Science ID 000178565200013

• In situ TEM studies of metal-carbon reactions MICROSCOPY AND MICROANALYSIS Sinclair, R., Itoh, T., Chin, R. 2002; 8 (4): 288-304

  Abstract

  The reactions which occur between amorphous carbon and a number of first transition metals (Ti, Cr, Fe, Co, Ni, and Cu) have been studied by transmission electron microscopy (TEM). The materials are in thin-film form with the metal layer sandwiched between thicker carbon layers. In four cases, the predominant reaction is the graphitization of the amorphous carbon, at temperatures well below 800 degrees C. This is brought about by the elements themselves in the case of Co and Ni, and by metastable carbides in the case of Fe (Fe3C) and Cr (Cr3C2-x). The Ti-C and Cu-C systems do not exhibit graphitization. For the former, only TiC is produced up to 1000 degrees C, while the carbon does not react at all with copper. In situ TEM studies show the mechanism to be of the dissolution-precipitation type, which is equivalent to the metal-mediated crystallization process for amorphous silicon and germanium. The heat of graphitization is found to be 18-19 kcal/mol-C by differential scanning calorimetry.

  View details for DOI 10.1017/S1431927602020226

  View details for Web of Science ID 000179056000007

  View details for PubMedID 12533226

• In Situ HREM of Crystallization Reactions Sinclair, R., Min, K., H. 2002
• In-Situ Heating Study of Materials Sinclair, R., Min, K., H. 2002
• Failure Analysis of Ferroelectric RAM Device by Transmission Electron Microscopy Baik, H., S., Park, G., S., Song, S., A., Lee, J., K., Sinclair, R. 2002
• Reactions in Metal-Carbon Systems Sinclair, R., Itoh, T., Chin, R. 2002
• TEM Microstructure Studies of Thin Film Magnetic Recording Media Sinclair, R., Kwon, U., Risner, J., D. 2002
• Grain Size Relationship Between the Magnetic Layer and the Underlayer in CoCrPtTa Recording Media Ma, K., Sinclair, R., Bertero, G., Cao, W. 2001
• Transmission Electron Microscopy of Computer Hard Disc, Magnetic Thin Films Sinclair, R. edited by Kawaii, T. 2001
• Quantitative EFTEM of Cr Grain Boundary Segregation in CoCrTa Wittig, J., E., Al-Sharab, J., F., Bentley, J., Evans, N., D., Nolan, T., P., Sinclair, R. 2001
• Microstructural Characterization of Longitudinal Magnetic Recording Media Sinclair, R., Park, D., W., Habermeier, C., Ma, K. 2001
• In Situ Transmission Electron Microscopy of Materials Sinclair, R., Min, K., H. edited by Chen, L., J. 2001
• Grain size analysis of longitudinal thin film media Park, D. W., Sinclair, R., Lal, B. B., Malhotra, S. S., Russak, M. A. AMER INST PHYSICS. 2000: 5687-5689

  View details for Web of Science ID 000086727200329

• In Situ HREM of Interface Reactions Sinclair, R. edited by Yoshihara, K. 2000
• Thermal stability of a Cu/Ta multilayer: An intriguing interfacial reaction Lee, H. J., Kwon, K. W., Ryu, C., Sinclair, R. PERGAMON-ELSEVIER SCIENCE LTD. 1999: 3965-3975

  View details for Web of Science ID 000084063800004

• A study of the failure mechanism of a titanium nitride diffusion barrier JOURNAL OF APPLIED PHYSICS Lee, H. J., Sinclair, R., Li, P., Roberts, B. 1999; 86 (6): 3096-3103

  View details for Web of Science ID 000082232400024

• Study of DC plasma oxidized Al2O3 barriers in spin dependent tunneling junctions using high resolution transmission electron microscopy Clark, T. E., Mancoff, F. B., Wang, S. X., Clemens, B. M., Sinclair, R. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1999: 2922-2924

  View details for Web of Science ID 000083151100223

• Case study of media noise mechanisms in longitudinal recording Yen, E. T., Wu, S. Z., Thomson, T., Ristau, R., Ranjan, R., Rauch, G. C., Habermeier, C., Sinclair, R. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1999: 2730-2732

  View details for Web of Science ID 000083151100165

• Solid-state amorphization at tetragonal-Ta/Cu interfaces APPLIED PHYSICS LETTERS Kwon, K. W., Lee, H. J., Sinclair, R. 1999; 75 (7): 935-937

  View details for Web of Science ID 000081928700018

• Wear-induced modifications of amorphous carbon in the presence of magnetic media Ramirez, A. G., Sinclair, R. AMER INST PHYSICS. 1999: 5597-5599

  View details for Web of Science ID 000079853500105

• Growth and characterization of epitaxial NiMnSb/PtMnSb C1(b) Heusler alloy superlattices JOURNAL OF MATERIALS RESEARCH Mancoff, F. B., Bobo, J. F., Richter, O. E., Bessho, K., Johnson, P. R., Sinclair, R., Nix, W. D., White, R. L., Clemens, B. M. 1999; 14 (4): 1560-1569

  View details for Web of Science ID 000082550400055

• Crystallization of amorphous carbon thin films in the presence of magnetic media JOURNAL OF APPLIED PHYSICS Ramirez, A. G., Itoh, T., Sinclair, R. 1999; 85 (3): 1508-1513

  View details for Web of Science ID 000078137100031

• Thermal Stability of a Cu/Ta Multilayer: an Intriguing Interfacial Reaction Acta Mater. Lee, H., J., Kwon, K., W., Ryu, C., Sinclair, R. 1999; 15/16 (47): 3965-3975
• Thermal Stability of the Copper/Tantalum Interfaces in Advanced Microelectronic Metallization Kwon, K., W., Lee, H., J., Sinclair, R. 1999
• Growth and Characterization of Epitaxial NiMnSb/PtMnSb C1b Heusler Alloy Superlattices J. Mater. Res. Mancoff, F., B., Bobo, J., F., Richter, O., Bessho, K., Johnson, P., R., Sinclair, R. 1999; 4 (14): 1560-1569
• Magnetic Imaging of Recording Media Sinclair, R., Tang, K. 1999
• Kinetic analysis of the C49-to-C54 phase transformation in TiSi2 thin films by in situ observation JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS Tanaka, H., Hirashita, N., Sinclair, R. 1998; 37 (8): 4284-4287

  View details for Web of Science ID 000076313100010

• Effects of ultra-high vacuum on crystallographic, recording and magnetic properties of thin film media Gao, C., Wu, S., Chen, J. P., Malmhall, R., Habermeier, C., Sinclair, R., Laidler, H., O'Grady, K. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1998: 1576-1578

  View details for Web of Science ID 000074852300246

• Chromium segregation in CoCrTa/Cr and CoCrPt/Cr thin films for longitudinal recording media Wittig, J. E., Nolan, T. P., Ross, C. A., Schabes, M. E., Tang, K., Sinclair, R., BENTLEY, J. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1998: 1564-1566

  View details for Web of Science ID 000074852300242

• Interfacial reaction in the poly-Si/Ta2O5/TiN capacitor system JOURNAL OF APPLIED PHYSICS Lee, H. J., Sinclair, R., Lee, M. B., Lee, H. D. 1998; 83 (1): 139-144

  View details for Web of Science ID 000071320400021

• Roughness Measurements of Thin SiO2 and poly-Si Interfaces Using High Resolution Cross-Sectional TEM Yamaguchi, M., Sinclair, R., Niwa, M. 1998
• Chromium Distrubution in CoCrTa/Cr Longitudinal Recording Media Wittig, J., E., Nolan, T., P., Sinclair, R., Bentley, J. 1998
• Evidence of heteroepitaxial growth of copper on beta-tantalum APPLIED PHYSICS LETTERS Kwon, K. V., Ryu, C., Sinclair, R., Wong, S. S. 1997; 71 (21): 3069-3071

  View details for Web of Science ID A1997YG83400013

• Wear effects on microstructural features of amorphous-carbon thin films Ramirez, A. G., Sinclair, R. ELSEVIER SCIENCE SA. 1997: 549-554

  View details for Web of Science ID 000070981000094

• Magnetic clusters, intergranular exchange interaction and their microstructural basis in thin film longitudinal media Tang, K., Schabes, M. E., Ross, C. A., He, L., Ranjan, R., Yamashita, T., Sinclair, R. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1997: 4074-4076

  View details for Web of Science ID A1997XW56500190

• Nanoroughness effect on Cr growth mechanism Chang, J. J., Chen, Q. X., Chen, G. L., Sinclair, R. AMER INST PHYSICS. 1997: 3943-3945

  View details for Web of Science ID A1997WV53600079

• Evolution of bicrystal media development Chang, J. J., Peng, Q. Z., Chen, Q. X., Lin, Z. H., Yen, E., Chen, G. L., Bertram, H. N., Sinclair, R. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1997: 885-890

  View details for Web of Science ID A1997WF01300031

• Evidence of Heteroepitaxial Growth of Copper on β-Tantalum Appl. Phys. Lett. Kwon, K., W., Ryu, C., Sinclair, R., Wong, S., S. 1997; 71: 3069-3071
• Evolution of Bicrystal Media IEEE Trans. Magn. Chang, J., K., Peng, Q., Chen, Q., Chen, G., L., Bertram, H., N., Sinclair, R. 1997; 33: 885-890
• Applications of TEM for Analysis of Local Failures Occurring During Si Metallization Process Lee, H., J., Sinclair, R. 1997
• Micromagnetic and Microstructure-Property Relationships in Magnetic Recording Media Sinclair, R., Tang, K., McKinlay, S., E. 1997
• Wear Effects on the Microstructural Features of Amorphous Carbon Thin Film Surf. Coat. Tech. Ramirez, A., Sinclair, R. 1997; 94-95: 549-554
• Structure-Property Relationships in Sputtered Magneto-optic Multilayers Sinclair, R., Bertero, G., A., Visokay, M., R. 1997
• Nano-roughness Effect on Cr Growth Mechanism J. Appl. Phys. Chang, J., K., Chen, Q., Chen, G., L., Sinclair, R. 1997; 8 (81): 3943-3946
• Diffusion Barrier Stability in ULSI Applications Sinclair, R., Lee, H., J., Kwon, K., W. 1997
• In Situ HREM of Reactions at Interfaces Sinclair, R., Itoh, T., Lee, H., J., Kwon, K., W. 1997
• Characterization of Ta as an underlayer for Cu Interconnects Kwon, K., W., Lee, H., J., Ryu, C., Sinclair, R., Wong, S., S. 1997
• Growth of alpha' nitrogen martensite and Fe16N2 films using (001)silicon substrates Clark, T. E., Visokay, M. R., Zhu, N. C., Sinclair, R. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1996: 3503-3505

  View details for Web of Science ID A1996VM25800047

• Analyses of stacking fault density in Co-alloy thin films by high-resolution transmission electron microscopy Ishikawa, A., Sinclair, R. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1996: 3605-3607

  View details for Web of Science ID A1996VM25800080

• Measurements of crystalline anisotropy on longitudinal media Chang, J. J., Peng, Q. Z., Bertram, H. N., Sinclair, R. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1996: 4902-4904

  View details for Web of Science ID A1996VM25900198

• Microstructure/magnetic property relationships in CoCrPt magnetic thin films McKinlay, S. E., FUSSING, N., Sinclair, R., Doerner, M. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1996: 3587-3589

  View details for Web of Science ID A1996VM25800074

• Thin film media with and without bicrystal cluster structure on glass ceramic substrates Chen, Q. X., Chang, J. J., Chen, G. L., Sinclair, R. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1996: 3599-3601

  View details for Web of Science ID A1996VM25800078

• Lorentz transmission electron microscopy study of micromagnetic structures in real computer hard disks Tang, K., Visokay, M. R., Ross, C. A., Ranjan, R., Yamashita, T., Sinclair, R. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1996: 4130-4132

  View details for Web of Science ID A1996VM25800245

• Atomically flat, ultra thin-SiO2/Si(001) interface formation by UHV healing Niwa, M., Okada, K., Sinclair, R. ELSEVIER SCIENCE BV. 1996: 425-430

  View details for Web of Science ID A1996VD64000089

• In situ observation of the C49-to-C54 phase transformation in TiSi2 thin films by transmission electron microscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS Tanaka, H., Hirashita, N., Sinclair, R. 1996; 35 (4B): L479-L481

  View details for Web of Science ID A1996UM42200006

• Structural comparisons of ion beam and de magnetron sputtered spin valves by high-resolution transmission electron microscopy Bailey, W. E., Zhu, N. C., Sinclair, R., Wang, S. X. AMER INST PHYSICS. 1996: 6393-6395

  View details for Web of Science ID A1996UG87800298

• Anomalous moment and anisotropy behavior in Fe3O4 films PHYSICAL REVIEW B Margulies, D. T., Parker, F. T., Spada, F. E., GOLDMAN, R. S., Li, J., Sinclair, R., Berkowitz, A. E. 1996; 53 (14): 9175-9187

  View details for Web of Science ID A1996UF06400055

• Magnetic and structural characteristics of sputtered barium ferrite thin films Li, J. S., Rosenbluem, S. S., Hayashi, H., Sinclair, R. ELSEVIER SCIENCE BV. 1996: 157-160

  View details for Web of Science ID A1996UU48500047

• As-deposited crystalline barium ferrite thin film media for longitudinal recording JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS Li, J. S., Sinclair, R., Rosenblum, S. S., Hayashi, H. 1996; 153 (1-2): 246-254

  View details for Web of Science ID A1996TY73300031

• Effects of Pt addition on the magnetic and crystallographic properties of Co-Cr-Pt thin-film media JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS Ishikawa, A., Sinclair, R. 1996; 152 (1-2): 265-273

  View details for Web of Science ID A1996TT38200039

• In Situ Atomic Resolution Electron Microscopy of Metal-Mediated Crystallization of Semiconductors Materials Science Forum Konno, T., J., Sinclair, R. 1996; 204-206: 749-754
• In Situ Observation of the C49-to-C54 Phase Transformation in TiSi2 Thin Films by Transmission Electron Microscopy Jpn. J. Appl. Phys. Lett. Tanaka, H., Hirashita, N., Sinclair, R. 1996; 35: L479-481
• Effects of Pt Addition on the Magnetic and Crystallographic Properties of Co-Cr-Pt Thin Film Media J. Magn. Magn. Mater. Ishikawa, A., Sinclair, R. 1996; 152: 265-273
• Structural Comparisons of Ion-Beam and RF Sputter-Deposited GMR Spin Valves by High Resolution Transmission Electron Microscopy J. Appl. Phys. Bailey, W., E., Zhu, N., C., Sinclair, R., Wang, S., X. 1996; 79: 6393-6395
• Strategies and Opportunities for In-Situ Electron Microscopy Sinclair, R. edited by Munoz, E., M. Rivera 1996
• Micromagnetic and Experimental Studies of CoPtCr Polycrystalline Thin Film Media with Bicrystal Microstructure IEEE Trans. Magn. Peng, Q., Bertram, H., N., Fussing, N., Doerner, M., F., Mirzamaani, M., Margulies, D., Sinclair, R. 1996; 31: 2821-2823
• Microstructure-Magnetic Property Relationships in CoCrPt Magnetic Thin Films IEEE Trans. Magn. McKinlay, S., Fussing, N., Sinclair, R., Doerner, M., F. 1996; 32: 3587-3589
• A Failure Mechanism of MOCVD TiN Diffusion Barriers at High Temperatures Lee, H., J., Li, P., Roberts, B., Sinclair, R. 1996
• Growth of a' Nitrogen-Martensite and Fe16N2 Films Using (001) Silicon Substrates IEEE Trans. Magn. Clark, T., E., Visokay, M., R., Zhu, N., Sinclair, R. 1996; 32: 3503-3505
• In Situ Electron and Tunneling Microscopy of Dynamic Processes edited by Sharma, R., Gai, P., L., Gajdardziska-Josifovska, M. 1996
• Thin Film Media With and Without Bicrystal Cluster Structure on Glass Ceramic Structures IEEE Trans. Magn. Chen, Q., Chang, J., K., Chen, G., L., Sinclair, R. 1996; 32: 3599-3601
• Physical characterization of two-dimensional doping profiles for process modeling Alvis, R., Luning, S., Thompson, L., Sinclair, R., Griffin, P. A V S AMER INST PHYSICS. 1996: 231-235

  View details for Web of Science ID A1996TV71000040

• MICROSTRUCTURAL EVOLUTION OF NIFE/AG MULTILAYERS STUDIED BY X-RAY-DIFFRACTION AND IN-SITU HIGH-RESOLUTION TEM JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS Snoeck, E., Sinclair, R., Parker, M. A., Hylton, T. L., Coffey, K. R., Howard, J. K., Lessmann, A., BIENENSTOCK, A. I. 1995; 151 (1-2): 24-32

  View details for Web of Science ID A1995TJ23000007

• KERR ROTATIONS AND ANISOTROPY IN (PT/CO/PT)/X MULTILAYERS Bertero, G. A., Sinclair, R. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1995: 3337-3342

  View details for Web of Science ID A1995TD55600233

• MICROMAGNETIC AND EXPERIMENTAL STUDIES OF COPTCR POLYCRYSTALLINE THIN-FILM MEDIA WITH BICRYSTAL MICROSTRUCTURE Peng, Q. S., Bertram, H. N., FUSSING, N., Doerner, M., Mirzamaani, M., Margulies, D., Sinclair, R., Lambert, S. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1995: 2821-2823

  View details for Web of Science ID A1995TD55600078

• HIGH-DENSITY RECORDING CHARACTERISTICS OF SPUTTERED BARIUM FERRITE THIN-FILMS Li, J. S., Rosenblum, S. S., NOJIMA, W., Hayashi, H., Sinclair, R. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1995: 2749-2751

  View details for Web of Science ID A1995TD55600054

• INTERFACIAL REACTIONS IN THE ZR-SI SYSTEM STUDIED BY IN-SITU TRANSMISSION ELECTRON-MICROSCOPY JOURNAL OF APPLIED PHYSICS Tanaka, H., Konno, T. J., Sinclair, R., Hirashita, N. 1995; 78 (8): 4982-4987

  View details for Web of Science ID A1995RY39600025

• REACTION-MEDIATED TEXTURING OF BARIUM FERRITE MAGNETIC THIN-FILMS ON ZNO UNDERLAYER JOURNAL OF MATERIALS RESEARCH Li, J. S., Sinclair, R., Rosenblum, S. S., Hayashi, H. 1995; 10 (9): 2343-2349

  View details for Web of Science ID A1995RQ71400024

• STRUCTURE AND CORROSION PROPERTIES OF AL/SI AND FE/ZR MULTILAYERS Nakayama, T., Yamamoto, K., Satoh, H., Konno, T. J., Clemens, B. M., Sinclair, R. ELSEVIER SCIENCE SA. 1995: 19-24

  View details for Web of Science ID A1995RQ43900004

• INTERFACE STRUCTURE AND PERPENDICULAR MAGNETIC-ANISOTROPY IN PT/CO MULTILAYERS JOURNAL OF APPLIED PHYSICS Bertero, G. A., Sinclair, R., Park, C. H., Shen, Z. X. 1995; 77 (8): 3953-3959

  View details for Web of Science ID A1995QU38700053

• DIRECT FORMATION OF ORDERED COPT AND FEPT COMPOUND THIN-FILMS BY SPUTTERING APPLIED PHYSICS LETTERS Visokay, M. R., Sinclair, R. 1995; 66 (13): 1692-1694

  View details for Web of Science ID A1995QN76700040

• METAL-MEDIATED CRYSTALLIZATION OF AMORPHOUS-GERMANIUM IN GERMANIUM SILVER LAYERED SYSTEMS PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES Konno, T. J., Sinclair, R. 1995; 71 (2): 179-199

  View details for Web of Science ID A1995QH55400006

• CRYSTALLIZATION OF AMORPHOUS-CARBON IN CARBON-COBALT LAYERED THIN-FILMS ACTA METALLURGICA ET MATERIALIA Konno, T. J., Sinclair, R. 1995; 43 (2): 471-484

  View details for Web of Science ID A1995QG02800007

• METAL-MEDIATED CRYSTALLIZATION OF AMORPHOUS-SILICON IN SILICON SILVER LAYERED SYSTEMS PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES Konno, T. J., Sinclair, R. 1995; 71 (2): 163-178

  View details for Web of Science ID A1995QH55400005

• Growth and characterization of FePt compound thin films MAGNETIC ULTRATHIN FILMS, MULTILAYERS AND SURFACES Visokay, M. R., Sinclair, R. 1995; 384: 91-96

  View details for Web of Science ID A1995BE33K00013

• HREM of Ultra-thin Oxides Sinclair, R., Niwa, M., Kouzaki, T. 1995
• In Situ TEM Study of Reactions in Iron/Amorphous Carbon Layered Thin Films Itoh, T., Sinclair, R. 1995
• (Pt/Co/Pt)/X Multilayer Thin Films for Magneto-Optic Media Bertero, G., A., Sinclair, R. 1995
• High Density Recording Characteristics of Sputtered Barium Ferrite Thin Films IEEE Trans. Magn. Li, J., Rosenblum, S., S., Nojima, W., Hayashi, H., Sinclair, R. 1995; 31: 2749-2751
• Direct Formation of Ordered CoPt and FePt Compound Thin Films by Sputtering Appl. Phys. Lett. Visokay, M., R., Sinclair, R. 1995; 66: 1692-1694
• Study of Diffusion Barrier Performance of MOCVD-TiN Lee, H., J., Sinclair, R., Roberts, B., E., Jackson, R. 1995
• TEM study of Crystallization of a-SiC in Contact with Silver Zhu, N., C., Sinclair, R. 1995
• In Situ Electron Microscopy and its Application to Semiconductor Reactions at High Resolution Sinclair, R. 1995
• Interface Reaction Enhanced Epitaxial Growth of Barium Ferrite Magnetic Thin Films Li, J., Sinclair, R., Rosenblum, S., S., Hayashi, H. 1995
• Formation of Epitaxial (001) Ordered FePd Films from Multilayer Precursors Visokay, M., R., Lairson, B., M., Clemens, B., M., Sinclair, R. 1995
• Thermochemical Properties and Phase Diagrams in Properties of Metal Silicides Sinclair, R., Madar, R., Setton, M. edited by Maex, K., van Rossum, M. Inst. Elec. Eng’rs, London. 1995: 95 - 152
• Formation of Epitaxial (001) Ordered FePd Films from Multilayer Precursors J. Mag. Soc. Jpn. Visokay, M., R., Lairson, B., M., Clemens, B., M., Sinclair, R. 1995; 19: 399-403
• Crystallization of Amorphous Carbon in Carbon-Cobalt Layered Thin Films Acta Metall. Mater. Konno, T., J., Sinclair, R. 1995; 43: 471-484
• Metal-Mediated Crystallization of Amorphous Germanium in Germanium-Silver Layered Systems Philos. Mag. B Konno, T., J., Sinclair, R. 1995; 71: 179-199
• Microstructural Evolution of NiFe/Ag Multilayers Studied by X-ray Diffraction and In Situ TEM J. Magn. Magn. Mater. Snoeck, E., Sinclair, R., Parker, M., A., Hylton, T., L., Coffey, K., R., Howard, J., K. 1995; 151: 24-32
• Pt/Co/Pt)/X Multilayer Thin Films for Magneto-Optic Media J. Mag. Soc. Jpn. Bertero, G., A., Sinclair, R. 1995; 19: 201-204
• Crystallization in metal-metalloid multilayers Sinclair, R., Konno, T. J., Itoh, T., Zhu, N. C. MATERIALS RESEARCH SOC. 1995: 3-8

  View details for Web of Science ID A1995BE43P00001

• Interfacial Reactions in the Zr/Si System Studied by In-Situ TEM J. Appl. Phys. Tanaka, H., Konno, T., J., Sinclair, R., Hiroshita, N. 1995; 78: 4982-4987
• Interface Structure and Perpendicular Magnetic Anisotropy in Pt/Co Multilayers J. Appl. Phys. Bertero, G., A., Sinclair, R., Park, C., H., Shen, Z., X. 1995; 77: 3953-3959
• Microstructural, Magnetic and Magneto-Optical Properties of (100) and (111) Oriented Thick ‘FCC’ Cobalt Single Crystal Ozkan, M., Suzuki, T., Miller, D., Kellock, A., Chang, C., A., Sinclair, R. 1995
• Microstructural, Magnetic and Magneto-Optical Properties of (100) and (111) Oriented Thick ‘FCC’ Cobalt Single Crystal J. Mag. Soc. Jpn. Ozkan, M., Suzuki, T., Miller, D., Kellock, A., Chang, C., A., Sinclair, R. 1995; 19 (S1): 267-270
• Reaction Mediated Texturing of Barium Ferrite Magnetic Thin Films J. Mater. Res. Li, J., Rosenblum, S., S., Hayashi, H., Sinclair, R. 1995; 10: 2343-2349
• Metal-Mediated Crystallization of Amorphous Silicon in Silicon-Silver Layered Systems Philos. Mag. B Konno, T., J., Sinclair, R. 1995; 71: 163-178
• IN-SITU HREM - APPLICATION TO METAL-MEDIATED CRYSTALLIZATION Sinclair, R., Konno, T. J. ELSEVIER SCIENCE BV. 1994: 225-232

  View details for Web of Science ID A1994PV84400023

• TEMPERATURE AND ORIENTATION EFFECTS ON THE MAGNETIC-PROPERTIES OF DOPED BARIUM FERRITE THIN-FILMS Li, J. S., Sinclair, R., Rosenblum, S. S., Hayashi, H. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1994: 4050-4052

  View details for Web of Science ID A1994PU42900083

• LONGITUDINAL RECORDING PERFORMANCE OF SPUTTERED BARIUM FERRITE MEDIA ON A CARBON RIGID DISK SUBSTRATE Rosenblum, S. S., Hayashi, H., Li, J. S., Sinclair, R. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1994: 4047-4049

  View details for Web of Science ID A1994PU42900082

• OXYGEN COULOMETRIC TITRATION STUDY OF M-BA-FERRITE SOLID STATE IONICS Li, J. S., Gur, T. M., Sinclair, R., Rosenblum, S. S., Hayashi, H. 1994; 73 (3-4): 185-188

  View details for Web of Science ID A1994PR98500004

• FORMATION OF EPITAXIAL FERROMAGNETIC INTERMETALLICS BY SOLID-STATE REACTION OF EPITAXIAL MULTILAYERS Clemens, B. M., Lairson, B. M., VISOKAY, M., Artymowicz, D., Sinclair, R. AMER CHEMICAL SOC. 1994: 518-INOR

  View details for Web of Science ID A1994PA26102693

• (PT/CO/PT)/X MULTILAYER FILMS WITH HIGH KERR ROTATIONS AND LARGE PERPENDICULAR MAGNETIC ANISOTROPIES APPLIED PHYSICS LETTERS Bertero, G. A., Sinclair, R. 1994; 64 (24): 3337-3339

  View details for Web of Science ID A1994NQ97900046

• THERMOCHEMICAL STABILITY OF BAFE12O19 AND BAFE2O4 AND PHASE-RELATIONS IN THE BA-FE-O TERNARY-SYSTEM JOURNAL OF MATERIALS RESEARCH Li, J. S., Gur, T. M., Sinclair, R., Rosenblum, S. S., Hayashi, H. 1994; 9 (6): 1499-1512

  View details for Web of Science ID A1994NN76400021

• STUDIES OF MATERIAL REACTIONS BY IN-SITU HIGH-RESOLUTION ELECTRON-MICROSCOPY MRS BULLETIN Sinclair, R. 1994; 19 (6): 26-31

  View details for Web of Science ID A1994NT03600004

• IN-SITU DYNAMIC HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY - APPLICATION TO PT/GAAS INTERFACIAL REACTIONS ULTRAMICROSCOPY Ko, D. H., Sinclair, R. 1994; 54 (2-4): 166-178

  View details for Web of Science ID A1994PA59800008

• NOISE PROPERTIES AND MICROSTRUCTURE OF ORIENTED COCRTA/CR MEDIA Ranjan, R., BENNETT, W. R., Tarnopolsky, G. J., Yamashita, T., Nolan, T., Sinclair, R. AMER INST PHYSICS. 1994: 6144-6146

  View details for Web of Science ID A1994NN73400251

• METAL-CONTACT-INDUCED CRYSTALLIZATION OF SEMICONDUCTORS Konno, T. J., Sinclair, R. ELSEVIER SCIENCE SA. 1994: 426-432

  View details for Web of Science ID A1994NN06000089

• STRUCTURE-PROPERTY CORRELATIONS IN PT/CO MULTILAYERS FOR MAGNETOOPTIC RECORDING JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS Bertero, G. A., Sinclair, R. 1994; 134 (1): 173-184

  View details for Web of Science ID A1994NP95700025

• CRYSTALLIZATION OF CO-SPUTTERED AMORPHOUS COBALT-CARBON ALLOYS - MORPHOLOGY AND KINETICS OF SPHERULITIC GROWTH Konno, T. J., Sinclair, R. ELSEVIER SCIENCE SA. 1994: 297-302

  View details for Web of Science ID A1994NN06000063

• CRYSTALLIZATION OF CO-SPUTTERED AMORPHOUS COBALT CARBON ALLOYS ACTA METALLURGICA ET MATERIALIA Konno, T. J., Sinclair, R. 1994; 42 (4): 1231-1247

  View details for Web of Science ID A1994NA12500018

• ATOMIC-ORDER PLANARIZATION OF ULTRATHIN SIO2/SI(001) INTERFACES Niwa, M., Kouzaki, T., Okada, K., Udagawa, M., Sinclair, R. JAPAN SOC APPLIED PHYSICS. 1994: 388-394

  View details for Web of Science ID A1994MV67800007

• Transmission Electron Microscopy of MOCVD Titanium Nitride Films Itoh, T., Konno, T., J., Sinclair, R., M. Raaijmakers, I., J.M., Roberts, B., E. 1994
• Polycrystalline Thin Films-Structure, Texture, Properties and Applications edited by Barmak, K., Parker, M., A., Floro, J., F. 1994
• Roughness Control and Electrical Properties of SiO/Si (001) Interfaces First International Symposium on Control of Semiconductor Interfaces, Elsevier, New York Niwa, M., Okada, K., Kouzaki, T., Sinclair, R. 1994: 405-410
• Reactions at Semiconductor Metal Interfaces First International Symposium on Control of Semiconductor Interfaces, Elsevier, New York Sinclair, R., Konno, T., J., Ko, D., H. 1994: 247-254
• Studies of Material Reactions by In-Situ High Resolution Electron Microscopy (HREM) MRS Bull. Sinclair, R. 1994; 6 (19): 26-31
• Effect of Interlayers Upon Texture and Magnetic Properties in Co Alloy Multilayers for Longitudinal Magnetic Recording Visokay, M., R., Kuwabara, M., Saffari, H., Hayashi, H., Sinclair, R., Onishi, Y. 1994
• CORRELATION OF STRUCTURE AND PROPERTIES IN THIN-FILM MAGNETIC MEDIA POLYCRYSTALLINE THIN FILMS: STRUCTURE, TEXTURE, PROPERTIES AND APPLICATIONS Nolan, T. P., Sinclair, R., Ranjan, R., Yamashita, T., Tarnopolsky, G., Bennett, W. 1994; 343: 297-302

  View details for Web of Science ID A1994BB59L00041

• Atomic-Order Planarization of Ultra-Thin SiO2/Si (001) Interfaces Jpn. J. Appl. Phys. Niwa, M., Kouzaki, T., Okada, K., Udagawa, M., Sinclair, R. 1994; 33: 388-394
• Longitudinal Recording Performance of Doped Barium Ferrite Magnetic Thin Films IEEE Trans. Magn. Rosenblum, S., S., Li, J., Hayashi, H., Sinclair, R. 1994; 30: 4047-4049
• Temperature and Orientation Effects on Magnetic Properties of Barium Ferrite Thin Films IEEE Trans. Magn. Li, J., Sinclair, R., Rosenblum, S., S., Hayashi, H. 1994; 30: 4050-4052
• In Situ HREM: Application to Metal-Mediated Crystallization Ultramicroscopy Sinclair, R., Konno, T., J. 1994; 56: 225-232
• Dynamic High Resolution Transmission Electron Microscopy: Application to Pt/GaAs Interfacial Reactions Ultramicroscopy Ko, D., H., Sinclair, R. 1994; 54: 166-178
• Crystallization of Co-sputtered Amorphous Cobalt-Carbon Alloys: Morphology and Kinetics of Spherulitic Growth Mater. Sci. Eng. Konno, T., J., Sinclair, R. 1994; A179/A180: 297-302
• Nickel Mediated Transformation of Amorphous Carbon to Graphite Itoh, T., Sinclair, R. 1994
• In-Situ TEM Observation of Interfacial Reactions in the Zr/Si System Tanaka, H., Konno, T., J., Sinclair, R. 1994
• Microscopic Interfacial Phenomena During Solid Phase Crystallization of Amorphous Silicon Thin Films: In-Situ CTEM and HREM Studies Guillemet, J., P., de Mauduit, B., Peiraggi, B., Sinclair, R., Konno, T., J. 1994
• TEM and In Situ HREM for Studying Metal-Semiconductor Interfacial Reactions Sinclair, R., Konno, T., J., Ko, D., H. edited by Limoge, Y., Bocquet, J., L. 1994
• Structure-Property Correlations in Pt/Co Multilayers for Magneto-Optic Recording J. Magn. Magn. Mater. Bertero, G., A., Sinclair, R. 1994; 134: 173-184
• Metal-Contact Induced Crystallization of Semiconductors Mater. Sci. Eng. A Konno, T., J., Sinclair, R. 1994; A179/A180: 426-432
• Correlation of Micro-structural, Micro-chemical and Micro-magnetic Properties of Longitudinal Recording Media Using CM20 FEG Lorentz TEM Nolan, T., P., Sinclair, R., Yamashita, T., Ranjan, R. 1994
• Effects of Substrate Temperature on Magnetic and Crystallographic Properties of Co-Cr-Pt/Cr Films Deposited by Laser Ablation Method Ishikawa, A., Shiroishi, Y., Sinclair, R. 1994
• Atomically Layered Structures for Magnetic Information Storage Lairson, B., M., Visokay, M., R., Sinclair, R., Brennan, S., N., Clemens, B., M. 1994
• Characterization of Sputtered Magnetic Barium-Ferrite Thin Films on Silicon Nitride Coated High Density Amorphous Carbon Substrates Li, J., Sinclair, R., Rosenblum, S., S., Hayashi, H. 1994
• In Situ HREM of Phase Reactions Sinclair, R., Konno, T., J., Ko, D., H. 1994
• Reactions at Semiconductor Metal Interfaces Sinclair, R., Konno, T., J., Ko, D., H. 1994
• Oxygen Coulometric Titration Study of M Ba-Ferrite Solid State Ionics Li, J., Gur, T., M., Sinclair, R., Rosenblum, S., S., Hayashi, H. 1994; 73: 185-188
• On The Perpendicular Magnetic Anisotropy of Co/Pt Multilayers: Structure-Property Relationships Bertero, G., A., Sinclair, R. 1994
• Crystallization of Co-sputtered Amorphous Cobalt-Carbon Alloys Acta Metall. Mater. Konno, T., J., Sinclair, R. 1994; 42: 1231-1247
• Observation of Ferroelectric Domain Walls in KTP by HREM Snoeck, E., Sinclair, R. 1994
• ³Roughness Control and Electrical Properties of SiO/Si (001) Interfaces Niwa, M., Okada, K., Kouzaki, T., Sinclair, R. 1994
• Thermochemical Stability of BaFe12O19 and BaFe2O4 and Phase Relations in the Ba-Fe-O Ternary System J. Mater. Res. Li, J., Gur, T., M., Sinclair, R., Rosenblum, S., S., Hayashi, H. 1994; 9: 1499-1512
• EPITAXIAL PTFE AND PTCO(001) THIN-FILMS WITH PERPENDICULAR MAGNETIC-ANISOTROPY Lairson, B. M., Visokay, M. R., Sinclair, R., Clemens, B. M. ELSEVIER SCIENCE BV. 1993: 577-579

  View details for Web of Science ID A1993MD35400165

• ANNEALING EFFECT ON STRUCTURE OF FE/ZR MULTILAYERS Yamamoto, K., Nakayama, T., Satoh, H., Konno, T. J., Sinclair, R. ELSEVIER SCIENCE BV. 1993: 128-130

  View details for Web of Science ID A1993MD35400036

• STRUCTURE AND CORROSION PROPERTIES OF AL/SI MULTILAYERS Nakayama, T., Konno, T. J., Satoh, H., Sinclair, R. ELSEVIER SCIENCE BV. 1993: 167-169

  View details for Web of Science ID A1993MD35400046

• CRYSTALLIZATION AND DECOMPOSITION OF CO-SPUTTERED AMORPHOUS SILICON-ALUMINUM THIN-FILMS MATERIALS CHEMISTRY AND PHYSICS Konno, T. J., Sinclair, R. 1993; 35 (2): 99-113

  View details for Web of Science ID A1993LT15400001

• INFLUENCE OF INTERFACIAL DOPING WITH RARE-EARTH ELEMENTS ON THE MAGNETIC-PROPERTIES OF SELECTED CO/PT MULTILAYERS Bertero, G. A., Sinclair, R., White, R. L. ELSEVIER SCIENCE BV. 1993: 275-278

  View details for Web of Science ID A1993MD35400074

• MICROSTRUCTURAL ANALYSIS OF MAGNETIC FE/PT MULTILAYER THIN-FILMS BY TRANSMISSION ELECTRON-MICROSCOPY Visokay, M. R., Lairson, B. M., Clemens, B. M., Sinclair, R. ELSEVIER SCIENCE BV. 1993: 136-140

  View details for Web of Science ID A1993MD35400038

• STRUCTURE AND CORROSION PROPERTIES OF FE/ZR MULTILAYERS Nakayama, T., Satoh, H., Konno, T. J., Clemens, B. M., Stevenson, D. A., Sinclair, R., HAGSTROM, S. B. ELSEVIER SCIENCE BV. 1993: 105-107

  View details for Web of Science ID A1993MD35400030

• ANNEALING OF METAL METALLOID MULTILAYERS STUDIED BY IN-SITU ELECTRON-MICROSCOPY Sinclair, R., Konno, T. J. ELSEVIER SCIENCE BV. 1993: 108-112

  View details for Web of Science ID A1993MD35400031

• ATOMIC-SCALE PLANARIZATION OF SIO2/SI(001) INTERFACES APPLIED PHYSICS LETTERS Niwa, M., Udagawa, M., Okada, K., KOUZAZKI, T., Sinclair, R. 1993; 63 (5): 675-677

  View details for Web of Science ID A1993LQ13300037

• EPITAXIAL TETRAGONAL PTCO (001) THIN-FILMS WITH PERPENDICULAR MAGNETIC-ANISOTROPY JOURNAL OF APPLIED PHYSICS Lairson, B. M., Visokay, M. R., Marinero, E. E., Sinclair, R., Clemens, B. M. 1993; 74 (3): 1922-1928

  View details for Web of Science ID A1993LQ12700071

• DIRECT OBSERVATION OF CRYSTALLIZATION IN SILICON BY IN-SITU HIGH-RESOLUTION ELECTRON-MICROSCOPY Sinclair, R., Morgiel, J., KIRTIKAR, A. S., Wu, I. W., Chiang, A. ELSEVIER SCIENCE BV. 1993: 41-45

  View details for Web of Science ID A1993LN79100006

• CRYSTALLOGRAPHIC ORIENTATION OF TEXTURED COCRTA/CR SPUTTERED THIN-FILM MEDIA FOR LONGITUDINAL RECORDING JOURNAL OF APPLIED PHYSICS Nolan, T. P., Sinclair, R., Ranjan, R., Yamashita, T. 1993; 73 (10): 5117-5124

  View details for Web of Science ID A1993LD85100056

• EFFECT OF MICROSTRUCTURAL FEATURES ON MEDIA NOISE IN LONGITUDINAL RECORDING MEDIA Nolan, T. P., Sinclair, R., Ranjan, R., Yamashita, T. AMER INST PHYSICS. 1993: 5566-5568

  View details for Web of Science ID A1993LD85400102

• TEM ANALYSIS OF CO-GD AND CO-GD MULTILAYER STRUCTURES JOURNAL OF MATERIALS RESEARCH Bertero, G. A., Hufnagel, T. C., Clemens, B. M., Sinclair, R. 1993; 8 (4): 771-774

  View details for Web of Science ID A1993KV48700015

• EPITAXIAL PTFE(001) THIN-FILMS ON MGO(001) WITH PERPENDICULAR MAGNETIC-ANISOTROPY APPLIED PHYSICS LETTERS Lairson, B. M., Visokay, M. R., Sinclair, R., Clemens, B. M. 1993; 62 (6): 639-641

  View details for Web of Science ID A1993KK92400034

• TRANSMISSION ELECTRON-MICROSCOPIC ANALYSIS OF MICROSTRUCTURAL FEATURES IN MAGNETIC RECORDING MEDIA Nolan, T. P., Sinclair, R., Ranjan, R., Yamashita, T. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1993: 292-299

  View details for Web of Science ID A1993KN28600043

• Atomic-Order Planarization of Ultra-Thin SiO2/Si (001) Interfaces Niwa, M., Kouzaki, T., Okada, K., Sinclair, R. 1993
• Application of High Resolution Electron Microscopy to the Study of Magnetic Thin Films and Multilayers Sinclair, R., Nolan, T., P., Bertero, G., A., Visokay, M., R. 1993
• Microstructural Analysis of Magnetic Fe/Pt Multilayer Thin Films by Transmission Electron Microscopy J. Magn. Magn. Mater. Visokay, M., R., Lairson, B., M., Clemens, B., M., Sinclair, R. 1993; 126: 136-140
• Deposition of Barium Ferrite Thin Films by RF Off-Axis Magnetron Sputtering Li, J., Sinclair, R., Rosenblum, S., S., Hayashi, H. 1993
• Reactions at the Ti-Si Interface Studied Using Hot Stage TEM Kirtikar, A., S., Sinclair, R. 1993
• Transmission Electron Microscopy of Epitaxial Fe/Pt Multilayers Visokay, M., R., Lairson, B., M., Clemens, B., M., Sinclair, R. 1993
• Crystallization and Decomposition of Co-sputtered Amorphous Silicon-Aluminum Thin Films Mater. Chem. Phys. Konno, J., Sinclair, R. 1993; 35: 99-113
• Transmission Electron Microscopic Analysis of Microstructural Features in Magnetic Recording Media IEEE Trans. Magn. Nolan, T., P., Sinclair, R., Ranjan, R., Yamashita, T. 1993; 29: 292-299
• Real Time Lattice Imaging of Crystallization in Amorphous Silicon Morgiel, J., Wu, I., W., Chiang, A., Sinclair, R. 1993
• Reactions in Metal-Metalloid Multilayers Sinclair, R., Konna, T., J. 1993
• Crystallographic Orientation of Textured CoCrTa/Cr Recording Media J. Appl. Phys. Nolan, T., P., Sinclair, R., Ranjan, R., Yamashita, T. 1993; 73: 5117-5124
• Magnetic Properties and Crystallography of Selected Co/Pt Multilayers with Rare-Earth Doped Interface Bertero, G., A., Sinclair, R. 1993
• Magnetic and Magneto-Optic Properties of PtFe(001) and PtCo(001) Thin Films Lairson, B., M., Visokay, M., R., Sinclair, R., Clemens, B., M. 1993
• Structural Properties of Uniaxial Tetragonal PtCo(001) and PtFe(001) Thin Films on MgO(001) Lairson, B., M., Visokay, M., R., Sinclair, R., Brennan, S., M., Clemens, B., M. 1993
• Evolution of Gd Thin Film Structure Due to Amorphization by Co-Deposition Hufnagel, T., C., Bertero, G., A., Sinclair, R., Clemens, B., M. 1993
• Transmission Electron Microscopy Study of PtCo(001) and PtFe(001) Films Formed from Epitaxial Pt/Co and Pt/Fe Multilayers Visokay, M., R., Lairson, B., M., Clemens, B., M., Sinclair, R. 1993
• Grain Separation Enhanced Magnetic Coercivity in Pt/Co Multilayers Bertero, G., A., Sinclair, R. 1993
• A Solid State Electrochemical Technique to Study Barium Ferrite Thermodynamic Stability Li, J., Gur, T., M., Sinclair, R., Rosenblum, S., S., Hayashi, H. 1993
• Crystallization of Amorphous Germanium in Silver-Germanium Layered Systems Konno, J., Sinclair, R. 1993
• In-Situ High Resolution Electron Microscopy of Metal-Contact Induced Crystallization of Semiconductors Konno, T., J., Sinclair, R. 1993
• Epitaxial Tetragonal PtCo(001) Thin Films with Perpendicular Magnetic Anisotropy J. Appl. Phys. Lairson, B., M., Visokay, M., R., Marinero, E., E., Sinclair, R., Clemens, B., M. 1993; 74: 1922-1928
• Epitaxial PtFe and PtCo(001) Thin Films with Perpendicular Magnetic Anisotropy J. Magn. Mag. Mater. Lairson, B., M., Visokay, M., R., Sinclair, R., Clemens, B., M. 1993; 126: 577-579
• Annealing of Metal Multilayers Studied by In Situ High Resolution Electron Microscopy J. Magn. Magn. Mater. Sinclair, R., Konno, T., J. 1993; 126: 108-112
• Influence of Interfacial Doping with Rare Earth Elements on the Magnetic Properties of Selected Co/Pt Multilayers J. Magn. Mag. Mater. Bertero, G., A., Sinclair, R. 1993; 126: 275-278
• TEM Analysis of Co-Gd and Cr-Gd Multilayer Structures J. Mater. Res. Bertero, A., Hufnagel, T., C., Clemens, B., M., Sinclair, R. 1993; 8: 771-774
• Epitaxial PtFe (001) Thin Films on MgO (001) with Perpendicular Magnetic Anisotropy Appl. Phys. Lett. Lairson, B., M., Visokay, M., R., Sinclair, R., Clemens, B., M. 1993; 62: 639-641
• Direct Solid State Phase Transformation from Co to Epitaxial CoSi in Co/Thin Ti/(100) Si Structure and its Application for Shallow Junction Formation Ogawa, S., Fair, J., A., Kouzaki, T., Sinclair, R., Jones, E., C., Cheung, N., W. 1993
• Production of c-Axis Oriented PtFe Thin Film with Perpendicular Magnetic Anisotropy Lairson, B., M., Visokay, M., R., Sinclair, R., Clemens, B., M. 1993
• Production of c-Axis Oriented PtFe Thin Film with Perpendicular Magnetic Anisotropy J. Magn. Soc. Jap. Lairson, B., M., Visokay, M., R., Sinclair, R., Clemens, B., M. 1993; 17 (S1): 40-43
• Transmission Electron Microscopy of Epitaxial Fe/Pt Multilayers J. Magn. Soc. Jap. Visokay, M., R., Lairson, B., M., Clemens, B., M., Sinclair, R. 1993; 17 (S1): 113-116
• Direct Observation of Crystallization in Silicon by In Situ High Resolution Electron Microscopy Ultramicroscopy Sinclair, R., Morgiel, J., Kirtikar, A., S., Wu, I., W., Chiang, A. 1993; 51: 41-45
• In Situ HREM of Interface Reactions Sinclair, R., Konno, T., J. 1993
• Structure and Magnetic Properties of Fe/Zr Multilayer Films Konno, T., J., Nakayama, T., Clemens, B., M., Sinclair, R. 1993
• MAGNETIC AND MAGNETOOPTIC PROPERTIES OF PTFE(001) AND PTCO(001) THIN-FILMS MAGNETIC ULTRATHIN FILMS Lairson, B. M., Visokay, M. R., Sinclair, R., Clemens, B. M. 1993; 313: 805-810

  View details for Web of Science ID A1993BZ22Y00110

• APPLICATION OF HIGH-RESOLUTION ELECTRON-MICROSCOPY TO THE STUDY OF MAGNETIC THIN-FILMS AND MULTILAYERS MAGNETIC ULTRATHIN FILMS Sinclair, R., Nolan, T. P., Bertero, G. A., Visokay, M. R. 1993; 313: 705-712

  View details for Web of Science ID A1993BZ22Y00095

• TRANSMISSION ELECTRON-MICROSCOPY STUDY OF COPT(001) AND FEPT(001) FILMS FORMED FROM EPITAXIAL CO/PT AND FE/PT MULTILAYERS PHASE TRANSFORMATIONS IN THIN FILMS - THERMODYNAMICS AND KINETICS Visokay, M. R., Lairson, B. M., Clemens, B. M., Sinclair, R. 1993; 311: 15-20

  View details for Web of Science ID A1993BY84Q00003

• CRYSTALLIZATION OF SILICON IN ALUMINUM AMORPHOUS-SILICON MULTILAYERS PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES Konno, T. J., Sinclair, R. 1992; 66 (6): 749-765

  View details for Web of Science ID A1992KC54900003

• MICROSTRUCTURE AND CRYSTALLOGRAPHY OF TEXTURED COCRTA/CR RECORDING MEDIA ULTRAMICROSCOPY Nolan, T. P., Sinclair, R., Ranjan, R., Yamashita, T. 1992; 47 (4): 437-446

  View details for Web of Science ID A1992KG29200018

• EPITAXIAL PT(001), PT(110), AND PT(111) FILMS ON MGO(001), MGO(110), MGO(111), AND AL2O3(0001) APPLIED PHYSICS LETTERS Lairson, B. M., Visokay, M. R., Sinclair, R., Hagstrom, S., Clemens, B. M. 1992; 61 (12): 1390-1392

  View details for Web of Science ID A1992JN99100008

• AMORPHOUS PHASE FORMATION AND INITIAL INTERFACIAL REACTIONS IN THE PLATINUM GAAS SYSTEM JOURNAL OF APPLIED PHYSICS Ko, D. H., Sinclair, R. 1992; 72 (5): 2036-2042

  View details for Web of Science ID A1992JK80400053

• STRUCTURAL DETERMINATION OF AMORPHOUS NI-TI THIN-FILMS USING ELECTRON-DIFFRACTION ANALYSIS ACTA METALLURGICA ET MATERIALIA Moine, P., Delage, J., Pelton, A. R., Sinclair, R. 1992; 40 (8): 1855-1863

  View details for Web of Science ID A1992JD12900008

• SIO2/SI INTERFACES STUDIED BY SCANNING TUNNELING MICROSCOPY AND HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY JOURNAL OF THE ELECTROCHEMICAL SOCIETY Niwa, M., Matsumoto, M., Iwasaki, H., Onada, M., Sinclair, R. 1992; 139 (3): 901-906

  View details for Web of Science ID A1992HH07700047

• MODELING OF AGGLOMERATION IN POLYCRYSTALLINE THIN-FILMS - APPLICATION TO TISI2 ON A SILICON SUBSTRATE JOURNAL OF APPLIED PHYSICS Nolan, T. P., Sinclair, R., Beyers, R. 1992; 71 (2): 720-724

  View details for Web of Science ID A1992HA64500027

• REACTIONS AT THE TITANIUM-SILICON INTERFACE STUDIED USING HOT-STAGE TEM ADVANCED METALLIZATION AND PROCESSING FOR SEMICONDUCTOR DEVICES AND CIRCUITS - II Kirtikar, A., Sinclair, R. 1992; 260: 227-231

  View details for Web of Science ID A1992BX05U00028

• Reaction and Stability at VLSI Contact Interfaces Ogawa, S., Sinclair, R. 1992
• Study of Semiconductor Metallization Problems by High Resolution Electron Microscopy and Thermodynamic Analysis Sinclair, R. 1992
• Two-Step Martensitic Transformations in TiNi (10% Cu) Shape Memory Alloys Moberly, W., J., Duerig, T., W., Proft, J., L., Sinclair, R. 1992
• Reactions at Solid Interfaces Sinclair, R., Ko, D., H., Konno, T., J., Nolan, T., P. 1992
• Crystallization of Amorphous Si in Al/Si Multilayers Konno, T., J., Sinclair, R. 1992
• Microstructure and Crystallography of Textured CoCrTa/Cr Sputtered Thin Film Media for Longitudinal Recording Ultramicroscopy Nolan, T., P., Sinclair, R., Ranjan, R.,  Yamashita, T. 1992; 47: 437-446
• Structural Determination of Amorphous Ni-Ti Thin Films, Using Electron Diffraction Analysis Acta Metall. Moine, P., Delage, J., Pelton, A., R., Sinclair, R. 1992; 40: 1855-1863
• Modeling of Agglomeration in Polycrystalline Thin Films: Application to TiSi2 on a Silicon Substrate J. Appl. Phys. Nolan, T., P., Sinclair, R., Beyers, R. 1992; 71: 720-724
• SiO2/Si Interfaces Studied by Scanning Tunneling Microscopy and High Resolution Transmission Electron Microscopy J. Electrochem. Soc. Niwa, M., Onoda, M., Matsumoto, M.,  Iwasaki, H., Sinclair, R. 1992; 139: 901-906
• Amorphous Phase Formation and the Initial Reactions at Pt/GaAs Interfaces Ko, D., H., Sinclair, R. 1992
• A Highly Reliable Sub-Half Micron Via and Interconnect Technology Using Al Alloy High-Temperature Sputter Filling Nishimura, H., Yamada, T., Sinclair, R., Ogawa, S. 1992
• Reaction and Stability at VLSI Contact Interfaces Jpn. Soc. Appl. Phys. Ogawa, S., Sinclair, R. 1992: 1268
• Crystallization of Silicon in Aluminum/Amorphous-Silicon Multilayers Philos. Mag. B Konno, T., J., Sinclair, R. 1992; 66: 749-765
• Epitaxial Pt (001), Pt (110) and Pt (111) Films on MgO (001), MgO (110), MgO (111) and Al2O3 (0001) Appl. Phys. Lett. Lairson, B., M., Visokay, M., R., Sinclair, R., Hagstrom, S., Clemens, B., M. 1992; 61: 1390-1392
• Reaction and Stability at ULSI Circuit Interfaces Sinclair, R., Ogawa, S. 1992
• Crystallization of Amorphous Silicon-Aluminum Thin Films: In-Situ Observation and Thermal Analysis Konno, T., J., Sinclair, R. 1992
• A Highly Reliable Sub-Half Micron Via and Interconnect Technology Using Al Alloy High-Temperature Sputter Filling VLSI Tech. Dig. Nishimura, H., Yamada, T., Sinclair, R., Ogawa, S. 1992: 74-75
• 2-STEP MARTENSITIC TRANSFORMATIONS IN TINI(10-PERCENT CU) SHAPE MEMORY ALLOYS SHAPE-MEMORY MATERIALS AND PHENOMENA - FUNDAMENTAL ASPECTS AND APPLICATIONS MOBERLY, W. J., Duerig, T. W., PROFT, J. L., Sinclair, R. 1992; 246: 55-60

  View details for Web of Science ID A1992BW94E00008

• METASTABLE AND EQUILIBRIUM DEFECT STRUCTURE OF II-VI/GAAS INTERFACES Schwartzman, A. F., Sinclair, R. MINERALS METALS MATERIALS SOC. 1991: 805-814

  View details for Web of Science ID A1991GH65700015

• STRUCTURE OF AN AMORPHOUS TI-SI ALLOY FORMED BY THERMAL-REACTION JOURNAL OF NON-CRYSTALLINE SOLIDS Holloway, K., Moine, P., Delage, J., Sinclair, R. 1991; 134 (1-2): 133-140

  View details for Web of Science ID A1991GF66500019

• INTERFACE MICROSTRUCTURE OF TITANIUM THIN-FILM SILICON SINGLE-CRYSTAL SUBSTRATE CORRELATED WITH ELECTRICAL BARRIER HEIGHTS JOURNAL OF APPLIED PHYSICS Ogawa, S., Kouzaki, T., Yoshida, T., Sinclair, R. 1991; 70 (2): 827-832

  View details for Web of Science ID A1991FY34100042

• AMORPHOUS PHASE FORMATION IN AN AS-DEPOSITED PLATINUM-GAAS INTERFACE APPLIED PHYSICS LETTERS Ko, D. H., Sinclair, R. 1991; 58 (17): 1851-1853

  View details for Web of Science ID A1991FJ59700016

• LOW-TEMPERATURE REACTIONS AT METAL-SEMICONDUCTOR INTERFACES INSTITUTE OF PHYSICS CONFERENCE SERIES Sinclair, R., Konno, T., Ko, D. H., Ogawa, S. 1991: 283-287

  View details for Web of Science ID A1991HJ30700056

• Reaction and Stability at Material Interfaces Sinclair, R. 1991
• Structure and Thermodynamics of Amorphous Titanium-Silicon Produced by Solid- State Interdiffusion Holloway, K., Moine, P., Delage, J.,  , Bormann, R., Sinclair, R., Capuano, L. 1991
• Amorphous-Phase Formation and Initial Reactions at Pt/GaAs Interfaces Ko, D., H., Sinclair, R. 1991
• An In Situ HREM Study of Crystal Nucleation in Amorphous Silicon Thin Films Kirtikar, A., S., Morgiel, J., Sinclair, R., Wu, I., W., Chiang, A. 1991
• Evidence for a Grain Boundary Grooving Model of Agglomeration in Polycrystalline TiSi2 Thin Films Nolan, T., Beyers, R., Sinclair, R. 1991
• Crystallization of Amorphous Si in Si/Al Multilayers Konno, T., J., Sinclair, R. 1991
• Metastable and Equilibrium Defect Structure of II/VI GaAs Interfaces J. Electron. Mater.  Schwartzman, A., F., Sinclair, R. 1991; 20: 805-814
• In Situ Heating Studies at High Resolution Sinclair, R. 1991
• Structure of an Amorphous Ti-Si Alloy Formed by Thermal Reaction J. Non-Cryst. Solids Holloway, K., Moine, P., Delage, J., Sinclair, R. 1991; 134: 133-140
• THERMOMECHANICAL STRENGTHENING OF B2 INTERMETALLICS MODELING THE DEFORMATION OF CRYSTALLINE SOLIDS MOBERLY, W. J., PROFT, J. L., Duerig, T. W., Pelton, A. R., Sinclair, R. 1991: 387-393

  View details for Web of Science ID A1991BV82Q00026

• EQUILIBRIUM DEFECT STRUCTURE OF ANNEALED II-VI/GAAS INTERFACES INSTITUTE OF PHYSICS CONFERENCE SERIES Schwartzman, A., Sinclair, R. 1991: 523-526

  View details for Web of Science ID A1991HJ30700102

• DEFORMATION, TWINNING AND THERMOMECHANICAL STRENGTHENING OF TI50NI47FE3 ACTA METALLURGICA ET MATERIALIA MOBERLY, W. J., PROFT, J. L., Duerig, T. W., Sinclair, R. 1990; 38 (12): 2601-2612

  View details for Web of Science ID A1990EN96200023

• SIO2/SI INTERFACES STUDIED BY STM AND HRTEM .2. Niwa, M., Onoda, M., Matsumoto, M., Iwasaki, H., Sinclair, R. JAPAN J APPLIED PHYSICS. 1990: 2665-2670

  View details for Web of Science ID A1990EN83000071

• PHASE REACTIONS AT SEMICONDUCTOR METALLIZATION INTERFACES BHANSALI, A. S., Ko, D. H., Sinclair, R. MINERALS METALS MATERIALS SOC. 1990: 1171-1175

  View details for Web of Science ID A1990EN80100004

• A THERMODYNAMIC APPROACH FOR INTERPRETING METALLIZATION LAYER STABILITY AND THIN-FILM REACTIONS INVOLVING 4 ELEMENTS - APPLICATION TO INTEGRATED-CIRCUIT CONTACT METALLURGY JOURNAL OF APPLIED PHYSICS BHANSALI, A. S., Sinclair, R., Morgan, A. E. 1990; 68 (3): 1043-1049

  View details for Web of Science ID A1990DP61600024

• STUDY OF INTERFACIAL REACTIONS IN METAL-SILICON AND RELATED SYSTEMS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY AND THERMODYNAMIC ANALYSIS MATERIALS TRANSACTIONS JIM Sinclair, R. 1990; 31 (7): 628-635

  View details for Web of Science ID A1990DU89000017

• THICKNESS MEASUREMENTS AND GROWTH-KINETICS OF THIN SIO2 LAYERS JOURNAL OF THE ELECTROCHEMICAL SOCIETY Carim, A. H., Sinclair, R. 1990; 137 (1): 279-283

  View details for Web of Science ID A1990CH81500052

• Thickness Measurements and Growth Kinetics of Thin SiO2 Layers J. Electrochem. Soc. Carim, A., H., Sinclair, R. 1990; 137: 279-283
• HRTEM and Nano-scale Microanalysis of the Titanium/Silicon Interfacial Reaction Correlated with Electrical Properties Ogawa, S., Kouzaki, T., Yoshida, T.,  , Sinclair, R. 1990
• In Situ HREM Observations of Crystallization in LPCVD Amorphous Silicon Morgiel, J., Wu, I., W., Chiang, A.,  , Sinclair, R. 1990
• Structure of the Ti-Single Crystal Si Interface Ogawa, S., Kouzaki, T., Yoshida, T., Sinclair, R. 1990
• Thermodynamic Stability of PtAl Thin Films on GaAs Ko, D., H., Sinclair, R. 1990
• Characterization of Metal Silicide/Silicon Interfaces Sinclair, R. 1990
• A Phase Diagram Approach for Predicting Reactions in Al/TiW (-Nitride) Thin-Film Systems Bhansali, A., S., M. Raaijmakers, I., J.M., Sinclair, R., Morgan, A., E., Burrow, B., J., Arst, M. 1990
• Interface Microstructure of Titanium Thin-Film / Silicon-Crystal Single Substrate, Correlated with Electrical Barrier Heights J. Appl. Phys. Ogawa, S., Yoshida, T., Kouzaki, T., Sinclair, R. 1990; 70: 827-832
• SiO2/Si Interfaces Studied by STM and HRTEM (II) Jpn. J. Appl. Phys. Niwa, M., Onoda, M.,  Matsumoto, M.,  Iwasaki, H., Sinclair, R. 1990; 29: 2665-2670
• Study of Interfacial Reactions in Metal-Silicon and Related Interfacial Reactions by High Resolution Electron Microscopy and Thermodynamic Analysis Mater. Trans. Jpn. Inst. Met. Sinclair, R. 1990; 31: 628-635
• A Thermodynamic Approach for Interpreting Metallization Layer Stability and Thin-Film Reactions Involving Four Elements: Application to Integrated Circuit Contact Metallurgy J. Appl. Phys. Bhansali, A., S., Sinclair, R., Morgan, A., E. 1990; 68: 1043-1049
• Microstructure-Property Studies for Semiconductor Interfaces Using High- Resolution Electron Microscopy Sinclair, R. edited by Craighead, H., G. , Gibson, J., M. 1990
• Twinning in Ternary Ti50Ni(50-x)Mx Alloys Moberly, W., J., Sinclair, R., Duerig, T., W. 1990
• High Resolution Electron Microscopy of Defects in Materials edited by Sinclair, R., Smith, D., J., Dahmen, U. 1990
• Metastable Phase Formation in Thin Films and Multilayers MRS Bull. Clemens, B., M., Sinclair, R. 1990; 2 (15): 19-28
• SiO2/Si Interfaces Studied by STM and HRTEM Niwa, M., Onoda, M., Iwasaki, H., Sinclair, R. 1990
• In Situ High-Resolution Electron Microscopy Sinclair, R. 1990
• Mechanical Twinning and Plasticity in Ti-Ni-Fe(3%) Moberly, W., J., Duerig, T., W., Proft, J., L. , Sinclair, R. edited by Muddle, B., C. 1990
• Deformation, Twinning and Thermo-Mechanical Strengthening of Ti50Ni47Fe3 Acta Metall. Moberly, W., J., Proft, J., L., Duerig, T., W., Sinclair, R. 1990; 38: 2601-2612
• AMORPHOUS SILICIDE FORMATION BY THERMAL-REACTION - A COMPARISON OF SEVERAL METAL-SILICON SYSTEMS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A Holloway, K., Sinclair, R., Nathan, M. 1989; 7 (3): 1479-1483

  View details for Web of Science ID A1989U715300171

• MORPHOLOGY OF THE SILICON IMPLANTED INTERFACE OF A POLYSILICON SINGLE-CRYSTAL SILICON STRUCTURE NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS Okuda, S., Ogawa, S., Kouzaki, T., Yoshida, T., Toujou, F., Sinclair, R. 1989; 39 (1-4): 334-337

  View details for Web of Science ID A1989T863200070

• A HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF THE FINE-STRUCTURE IN A TRENCH CAPACITOR JOURNAL OF THE ELECTROCHEMICAL SOCIETY Sinclair, R., Kim, K. B., SHIPPOU, O., Iwasaki, H. 1989; 136 (2): 511-518

  View details for Web of Science ID A1989T291400042

• STRUCTURE AND ELECTRICAL-PROPERTIES OF INTERFACES BETWEEN SILICON FILMS AND N+ SILICON-CRYSTALS JOURNAL OF APPLIED PHYSICS Ogawa, S., Okuda, S., Yoshida, T., Kouzaki, T., Tsukamoto, K., Sinclair, R. 1989; 65 (2): 668-671

  View details for Web of Science ID A1989R720400040

• INTERFACIAL REACTIONS ON ANNEALING MOLYBDENUM-SILICON MULTILAYERS JOURNAL OF APPLIED PHYSICS Holloway, K., DO, K. B., Sinclair, R. 1989; 65 (2): 474-480

  View details for Web of Science ID A1989R720400009

• REACTION AND STRUCTURE AT METAL-SEMICONDUCTOR INTERFACES INSTITUTE OF PHYSICS CONFERENCE SERIES Sinclair, R., Holloway, K., Kim, K. B., Ko, D. H., BHANSALI, A. S., Schwartzman, A. F., Ogawa, S. 1989: 599-607

  View details for Web of Science ID A1989FN49500094

• Amorphous Silicide Formation by Thermal Reaction: A Comparison of Several Metal-Silicon Systems J. Vac. Sci. Technol. A Holloway, K., Sinclair, R., Nathan, M. 1989; 7: 1479-1483
• Twinless Martensite in TiNiCu Shape Memory Alloys Moberly, W., J., Duerig, T., W., Proft, J., L. , Sinclair, R. 1989
• Structure and Reaction at Metal-Semiconductor Interfaces Sinclair, R., Ogawa, S. 1989
• Reactions at Metal-Semiconductor Interfaces Sinclair, R. 1989
• Morphology of the Silicon Implanted Interface of a Polysilicon/Single Crystal Silicon Structure Jpn. Nucl. Instr. Meth. Phys. Res. B Okuda, S., Ogawa, S., Kouzaki, T., Yoshida, T., Toujou, F., Sinclair, R. 1989; 39: 334-337
• Quaternary Phase Equilibria in the Ti-Si-N-O System: Stability of Metallization Layers and Prediction of Thin Film Reactions Bhansali, A., S., Sinclair, R. 1989
• HREM In Situ Annealing of the CdTe/GaAs Heterojunction Schwartzman, A., F., Sinclair, R. 1989
• Transmission Electron Microscopy and High Resolution Scanning Electron Microscopy of Co-Ni-Pt Thin Film Magnetic Recording Media Chan, L., Yamashita, T., Sinclair, R. 1989
• Phase Equilibria at Semiconductor Interfaces Sinclair, R., Bhansali, A., S., Schwartzman, A., F. edited by Smith, F., W. 1989
• Structure and Electrical Properties of Interfaces Between Silicon Films and n+ Silicon Crystals J. Appl. Phys. Ogawa, S., Okuda, S., Yoshida, T., Kouzaki, T., Tsukamoto, K., Sinclair, R. 1989; 65: 668-671
• A High-Resolution Electron Microscopy Study of the Fine Structure in a Trench Capacitor J. Electrochem. Soc. Sinclair, R., Kim, K., B., Shippou, O., Iwasaki, H. 1989; 136: 511-518
• In Situ Annealing Transmission Electron Microscopy (TEM) Study of Ti/GaAs and Ni/GaAs Interfacial Reactions Kim, K., B., Sinclair, R. 1989
• Structure and Reaction at Metal-Semiconductor Interfaces Jpn. Soc. Appl. Phys., Catalog No. AP892228 Sinclair, R., Ogawa, S. 1989: 29-33
• In Situ High Resolution Electron Microscopy Sinclair, R. 1989
• COMPRESSIVE DEFORMATION AND FRACTURE IN WC MATERIALS MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING Rowcliffe, D. J., Jayaram, V., HIBBS, M. K., Sinclair, R. 1988; 106: 299-303

  View details for Web of Science ID A1988R829600001

• THE DEVELOPMENT OF INSITU HIGH-RESOLUTION ELECTRON-MICROSCOPY ACTA CRYSTALLOGRAPHICA SECTION A Sinclair, R., Yamashita, T., Parker, M. A., Kim, K. B., Holloway, K., Schwartzman, A. F. 1988; 44: 965-975

  View details for Web of Science ID A1988R253400029

• PHASE-DIAGRAMS IN SEMICONDUCTOR METALLIZATION Sinclair, R. MINERALS METALS MATERIALS SOC. 1988: 44-44

  View details for Web of Science ID A1988R143400377

• HIGH-RESOLUTION AND INSITU TEM STUDIES OF ANNEALING OF TI-SI MULTILAYERS JOURNAL OF THE LESS-COMMON METALS Holloway, K., Sinclair, R. 1988; 140: 139-148

  View details for Web of Science ID A1988N867700017

• INTERFACIAL REACTIONS IN THE TI GAAS SYSTEM JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A Kim, K. B., KNIFFIN, M., Sinclair, R., Helms, C. R. 1988; 6 (3): 1473-1477

  View details for Web of Science ID A1988N974800035

• STRUCTURAL DETERMINATION OF SMALL AMORPHOUS VOLUMES BY ELECTRON-DIFFRACTION JOURNAL OF NON-CRYSTALLINE SOLIDS Moine, P., Pelton, A. R., Sinclair, R. 1988; 101 (2-3): 213-222

  View details for Web of Science ID A1988N802200008

• DISORDERED INTERMIXING AT THE PLATINUM-SILICON INTERFACE DEMONSTRATED BY HIGH-RESOLUTION CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY, AUGER-ELECTRON SPECTROSCOPY, AND MEV ION CHANNELING JOURNAL OF APPLIED PHYSICS Abelson, J. R., Kim, K. B., Mercer, D. E., Helms, C. R., Sinclair, R., Sigmon, T. W. 1988; 63 (3): 689-692

  View details for Web of Science ID A1988L836200013

• Interfacial Reactions in the Ti/GaAs System J. Vac. Sci. Technol. A Kim, K., B., Kniffin, M., Sinclair, R., Helms, C., R. 1988; 6: 1473-1477
• Microstructures of Polysilicon Sinclair, R., Carim, A., H., Morgiel, J., Bravman, J., C. 1988
• High-resolution and In Situ TEM Studies of Annealing of Ti-Si Multilayers J. Less Common Metals Holloway, K., Sinclair, R. 1988; 140: 139-148
• Disordered Intermixing at the Platinum-Silicon Interface Demonstrated by High-resolution Cross-sectional Transmission Electron Microscopy, Auger Electron Spectroscopy and MeV Ion Channeling J. Appl. Phys. Abelson, J., R., Kim, K., B., Mercer, D., E., Helms, C., R., Sinclair, R., Sigmon, T., W. 1988; 63: 689-692
• Structural Determination of Small Amorphous Volumes by Electron Diffraction J. Non-Cryst. Solids Moine, P., Pelton, A., R., Sinclair, R. 1988; 101: 213-222
• In-Situ and High-Resolution TEM Observation of Interfacial Reactions in Metal- Silicon Multilayers Holloway, K., Do, K., B., Sinclair, R. 1988
• The Development of In Situ High Resolution Electron Microscopy Sinclair, R., Yamashita, T., Parker, M., A., Kim, K., B., Holloway, K., Schwartzman, A., F. 1988; 44: 965-975
• PHASE-DIAGRAMS AND INSITU HIGH-RESOLUTION ELECTRON-MICROSCOPY OF METAL-SEMICONDUCTOR SYSTEMS Kim, K. B., Bhansali, A., Holloway, K. C., Sinclair, R. MINERALS METALS MATERIALS SOC. 1987: A7-A8

  View details for Web of Science ID A1987K763800063

• KINETICS AND OXIDE COMPOSITION FOR THERMAL-OXIDATION OF CADMIUM TELLURIDE JOURNAL OF APPLIED PHYSICS Wang, F., Schwartzman, A., FAHRENBRUCH, A. L., Sinclair, R., BUBE, R. H., Stahle, C. M. 1987; 62 (4): 1469-1476

  View details for Web of Science ID A1987J402800052

• HIGH-RESOLUTION ELECTRON-MICROSCOPY AND SCANNING TUNNELING MICROSCOPY OF NATIVE OXIDES ON SILICON SCIENCE Carim, A. H., DOVEK, M. M., Quate, C. F., Sinclair, R., VORST, C. 1987; 237 (4815): 630-633

  Abstract

  High-resolution transmission electron microscopy and scanning tunneling microscopy have been combined to examine the structure of the thin "native" oxide that forms on silicon surfaces at room temperature. Differences in the cleaning procedures for silicon wafers may affect the morphology of this oxide and critically influence further processing on the silicon substrates. An etch that ended with a dip in hydrofluoric acid provided a thinner oxide and a lower interface step density than did a sulfuric peroxide treatment. The availability of complementary information from high-resolution transmission electron microscopy and scanning tunneling microscopy is discussed.

  View details for Web of Science ID A1987J472200024

  View details for PubMedID 17758564

• PHASE-EQUILIBRIA IN METAL-GALLIUM-ARSENIC SYSTEMS - THERMODYNAMIC CONSIDERATIONS FOR METALLIZATION MATERIALS JOURNAL OF APPLIED PHYSICS Beyers, R., Kim, K. B., Sinclair, R. 1987; 61 (6): 2195-2202

  View details for Web of Science ID A1987G327200014

• THE EVOLUTION OF SI/SIO2 INTERFACE ROUGHNESS JOURNAL OF THE ELECTROCHEMICAL SOCIETY Carim, A. H., Sinclair, R. 1987; 134 (3): 741-746

  View details for Web of Science ID A1987G410200046

• AMORPHOUS TI-SI ALLOY FORMED BY INTERDIFFUSION OF AMORPHOUS SI AND CRYSTALLINE TI MULTILAYERS JOURNAL OF APPLIED PHYSICS Holloway, K., Sinclair, R. 1987; 61 (4): 1359-1364

  View details for Web of Science ID A1987F969900016

• HIGH-RESOLUTION ELECTRON-MICROSCOPY OF STRUCTURAL FEATURES AT THE SI/SIO2 INTERFACE MATERIALS LETTERS Carim, A. H., Sinclair, R. 1987; 5 (3): 94-98

  View details for Web of Science ID A1987G365300009

• Kinetics & Oxide Composition for Thermal Oxidation of Cadmium Telluride J. Appl. Phys. Wang, F., Schwartzman, A., Fahrenbruch, A., L., Sinclair, R., Bube, R., H., Stahle, C., M. 1987; 62: 1469-1476
• Phase Equilibria in Metal-Gallium-Arsenic Systems: Thermodynamic Considerations for Metallization Materials J. Appl. Phys. Beyers, R., Kim, K., B., Sinclair, R. 1987; 61: 2195-2202
• In Situ High Resolution Electron Microscopy for Interface Studies Parker, M., A., Sinclair, R. 1987
• Interfacial Reactions in Titanium-Silicon Multilayers Holloway, K., Sinclair, R. 1987
• In Situ HREM of Interface Reactions in Semiconductors Ultramicroscopy Sinclair, R., Parker, M., A., Kim, K., B. 1987; 23: 383-396
• Characterization of Defects in Materials edited by Siegel, R., W., Weertman, J., R., Sinclair, R. 1987
• High-Resolution Electron Microscopy and Scanning Tunneling Microscopy of Native Oxides on Silicon Science Carim, A., H., Dovek, M., M., Quate, C., F., Sinclair, R., Vorst, C. 1987; 237: 630-633
• High-Resolution Electron Microscopy of Structural Features at the Si/SiO2 Interface MateR. Letts. Carim, A., H., Sinclair, R. 1987; 5: 94-98
• PLASTIC-DEFORMATION OF WC-CO AT HIGH CONFINING PRESSURE SCRIPTA METALLURGICA Jayaram, V., Kronenberg, A., Kirby, S. H., Rowcliffe, D. J., Sinclair, R. 1986; 20 (5): 701-705

  View details for Web of Science ID A1986C225900022

• DEFORMATION ENHANCED DECARBURIZATION OF WC-CO SCRIPTA METALLURGICA Jayaram, V., Sinclair, R., Rowcliffe, D. J. 1986; 20 (1): 55-60

  View details for Web of Science ID A1986AYB8400011

• Crystalline-To-Amorphous Transitions in Ti-Ni Alloys Pelton, A., R., Moine, P., Noak, M., A., Sinclair, R. 1986
• The Evolution of Si/SiO Interface Roughness Carim, A., H., Sinclair, R. edited by Huff, H., R., Abe, T., Kolbesen, B. 1986
• Electron Microscope in 1987 Yearbook of Science and Technology Sinclair, R. McGraw-Hill, New York. 1986: 173-176
• High Resolution Transmission Electron Microscope Observations of Silicon Regrowth at Controlled Elevated Temperatures Nature Sinclair, R., Parker, M., A. 1986; 322: 531-533
• Plastic Deformation of WC-Co at High Confining Pressure Scripta Met. Jayaram, V., Kronenberg, A., Kirby, S., H., Rowcliffe, D., J., Sinclair, R. 1986; 20: 701-705
• In Situ HREM and HVEM Studies of Silicon Epitaxial Regrowth Parker, M., A. , Sinclair, R. 1986
• METASTABLE PHASE FORMATION IN TITANIUM-SILICON THIN-FILMS JOURNAL OF APPLIED PHYSICS Beyers, R., Sinclair, R. 1985; 57 (12): 5240-5245

  View details for Web of Science ID A1985AJN5500019

• Characterization of Emitter-Collector Shorts by Anodization, Voltage Contrast SEM and TEM Carim, A., H., Sinclair, R., Stacy, W., T. 1985
• In-Situ High Resolution Transmission Electron Microscopy of Dynamic Events During the Amorphous to Crystalline Phase Transformation in Silicon Parker, M., A., Sigmon, T., W., Sinclair, R. 1985
• Morphological Studies of Polysilicon Emitter Contacts Bravman, J., C., Patton, G., L., Sinclair, R., Plummer, J., D. 1985
• Silicon on Sapphire of Single Crystal Quality Obtained by Double Solid Phase Expitaxial Regrowth Parker, M., A., Sigmon, T., W., Sinclair, R. 1985
• Precipitation of Phosphorus and Tin in Temper Embrittled Low Alloy Steel Scripta Met. Wittig, J., E., Sinclair, R., Viswanathan, R. 1985; 19: 111-116
• In Situ TEM Study of Martensitic NiTi Amorphization by Ni Ion Implantation Nucl. Instrum. Methods B Moine, P., Riviere, J., P., Ruault, M., O., Chaumont, J., Pelton, A., Sinclair, R. 1985; 7/8: 20-25
• Direct Observation of Defect Motion in Silicon By High Resolution Transmission Electron Microscopy Parker, M., A., Sinclair, R. 1985
• Silicon Nitride Joining J. Am. Ceram. Soc. Mecartney, M., L., Sinclair, R., E. Loehman, R. 1985; 68: 472-478
• Metastable Phase Formation in Titanium-Silicon Thin Films J. Appl. Phys. Beyers, R., Sinclair, R. 1985; 57: 5240-5245
• Lattice Images of Defect Free Silicon-On-Sapphire Prepared by Ion Implantation Appl. Phys. Lett. Parker, M., A., Sinclair, R., Sigmon, T., W. 1985; 47: 626-628
• Delineation of Emitter-Collector Shorts in Bipolar Test Structures by Voltage Contrast Scanning Electron Microscopy SEM Carim, A., H., Sinclair, R., Stacy, W., T. 1985; III: 1047-1053
• MECHANICAL TWINNING IN TI50NI47FE3 AND TI49NI51 ALLOYS ACTA METALLURGICA Goo, E., Duerig, T., Melton, K., Sinclair, R. 1985; 33 (9): 1725-1733

  View details for Web of Science ID A1985APP5200016

• PRECIPITATION OF PHOSPHORUS AND TIN IN TEMPER EMBRITTLED LOW-ALLOY STEEL SCRIPTA METALLURGICA Wittig, J. E., Sinclair, R., Viswanathan, R. 1985; 19 (1): 111-116

  View details for Web of Science ID A1985AAR4700022

• LATTICE IMAGES OF DEFECT-FREE SILICON ON SAPPHIRE PREPARED BY ION-IMPLANTATION APPLIED PHYSICS LETTERS Parker, M. A., Sinclair, R., Sigmon, T. W. 1985; 47 (6): 626-628

  View details for Web of Science ID A1985AQH1900032

• DELINEATION OF EMITTER-COLLECTOR SHORTS IN BIPOLAR TEST STRUCTURES BY VOLTAGE CONTRAST SCANNING ELECTRON-MICROSCOPY SCANNING ELECTRON MICROSCOPY Carim, A. H., Sinclair, R., STACY, W. T. 1985: 1047-1053

  View details for Web of Science ID A1985ATA9300013

• INSITU TEM STUDY OF MARTENSITIC NITI AMORPHIZATION BY NI ION-IMPLANTATION NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS Moine, P., Riviere, J. P., Ruault, M. O., Chaumont, J., Pelton, A., Sinclair, R. 1985; 7-8 (MAR): 20-25

  View details for Web of Science ID A1985AGM5800004

• DEFECT INTERACTIONS IN DEFORMED WC ACTA METALLURGICA HIBBS, M. K., Sinclair, R., Rowcliffe, D. J. 1984; 32 (6): 941-947

  View details for Web of Science ID A1984SX48200014

• Thin Foil Artifacts Observed in Electron Diffraction on a TiNi Alloy Scripta Met. Moine, P., Goo, E., Sinclair, R. 1984; 18: 1143-1147
• Structural Determination of Amorphous Ti-Ni Alloys Pelton, A., R., Moine, P., Sinclair, R. 1984
• High Resolution Electron Microscopy in Quantitative Electron Microscopy Sinclair, R. edited by Chapman, J., N., Craven, A., J. SUSSP Publications, Edinburgh. 1984: 341-350
• Phase Equilibria in Thin-Film Metallizations J. Vac. Sci. Technol., Beyers, R., Sinclair, R., Thomas, M., E. 1984; B2: 781-784
• The Morphology of the Polysilicon-SiO2 Interface Bravman, J., C., Sinclair, R. 1984
• The Preparation of Cross-Section Specimens for Transmission Electron Microscopy J. Electron Microsc. Tech. Bravman, J., C., Sinclair, R. 1984; 1: 53-61
• Cadmium Telluride Films and Solar Cells IEEE Trans. Electron Devices Bube, R., H., Fahrenbruch, A., Sinclair, R., Anthony, T., C., Fortmann, C., Huber, W. 1984; ED-31: 528-538
• CADMIUM TELLURIDE FILMS AND SOLAR-CELLS IEEE TRANSACTIONS ON ELECTRON DEVICES BUBE, R. H., FAHRENBRUCH, A. L., Sinclair, R., Anthony, T. C., FORTMANN, C., Huber, W., Lee, C. T., Thorpe, T., Yamashita, T. 1984; 31 (5): 528-538

  View details for Web of Science ID A1984SQ49200003

• THIN FOIL ARTIFACTS OBSERVED IN ELECTRON-DIFFRACTION ON A TI49.5NI50.5 ALLOY SCRIPTA METALLURGICA Moine, P., Goo, E., Sinclair, R. 1984; 18 (10): 1143-1147

  View details for Web of Science ID A1984TP01100023

• PHASE-EQUILIBRIA IN THIN-FILM METALLIZATIONS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B Beyers, R., Sinclair, R., Thomas, M. E. 1984; 2 (4): 781-784

  View details for Web of Science ID A1984TV91800031

• INTERGRANULAR CRACKING IN WC-6-PERCENT CO - AN APPLICATION OF THE VONMISES CRITERION ACTA METALLURGICA Jayaram, V., Sinclair, R., Rowcliffe, D. J. 1983; 31 (3): 373-378

  View details for Web of Science ID A1983QF43300003

• Defect Structure of WC Deformed at Room and High Temperatures Hibbs, M., K., Rowcliffe, D., J., Sinclair, R. edited by Viswanathan, R., K., Rowcliffe, D., J., Gurland, J. 1983
• Transmission Electron Microscopy Studies of the Polycrystalline Silicon – SiO2 Interface Thin Solid Films Bravman, J., C., Sinclair, R. 1983; 104: 153-161
• Lattice Imaging of CdS/CdTe Solar Cell Interface Yamashita, T., Werthen, J., G., Bube, R., H., Sinclair, R. edited by Bailey, G., W. 1983
• HREM of Interfaces and Defects in Semiconductors Sinclair, R. 1983
• Detection of Thin Intergranular Cobalt Layers in WC-Co Composites by Lattice Imaging J. Am. Ceram. Soc. Jayaram, V., Sinclair, R. 1983; 66: C137-C139
• Observation of Dislocation Reactions in CdTe at Lattice Resolution Yamashita, T., Sinclair, R. 1983
• High Voltage High Resolution Electron Microscopy of Compound Semiconductors Sinclair, R., Ponce, F., A., Yamashita, T., Smith, David, J. 1983
• Microstructural Characterization of Deformation and Precipitation in (W, Ti)C Shinde, S., L., Jayaram, V., Sinclair, R. edited by Viswanathan, R., K., Rowcliffe, D., J., Gurland, J. 1983
• High Resolution Electron Microscopy II-VI Compound Semiconductors Sinclair, R., Ponce, F., A., Yamashita, T., Smith, David, J. 1983
• Intergranular Cracking in WC-6%Co: An Application of the von Mises Criterion Acta Metall. Jayaram, V., Sinclair, R., Rowcliffe, D., J. 1983; 31: 373-378
• Transmission Electron Microscopy of Annealed ZrO2+8Mol%Sc2O3 J. Am. Ceram. Soc. Moghadam, F., K., Yamashita, T., Sinclair, R., Stevenson, D., A. 1983; 66: 213-217
• CHARACTERIZATION OF THE LATTICE DISPLACEMENT WAVES IN PRE-MARTENSITIC TINI ACTA METALLURGICA Michal, G. M., Moine, P., Sinclair, R. 1982; 30 (1): 124-138

  View details for Web of Science ID A1982MX59800015

• Lattice Resolution Movie of Defect Modification in Cadmium Telluride Sinclair, R., Smith, D., J., Erasmus, S., J., Ponce, F., A. 1982
• The Effect of Oxygen in Cosputtered (Titanium + Silicon) Films Beyers, R., Sinclair, R., Thomas, M., E. edited by Corbett, J., W., Mahajan, S. 1982
• Applications of the 2 1/2 D TEM Technique Sinclair, R. 1982
• DYNAMIC OBSERVATION OF DEFECT ANNEALING IN CDTE AT LATTICE RESOLUTION NATURE Sinclair, R., Ponce, F. A., Yamashita, T., SMITH, D. J., Camps, R. A., Freeman, L. A., Erasmus, S. J., Nixon, W. C., Smith, K. C., Catto, C. J. 1982; 298 (5870): 127-131

  View details for Web of Science ID A1982NW89400030

• Dynamic Observation of Atomic-Level Events in Cadmium Telluride by High Resolution TEM Yamashita, T., Sinclair, R. edited by Corbett, J., W., Mahajan, S. 1982
• High Resolution Lattice Imaging of Cadmium Telluride Philos. Mag. Yamashita, T., Ponce, F., A., Pirouz, P., Sinclair, R. 1982; A45: 693-711
• Characterization of the Lattice Displacement Waves in Premartensitic TiNi Acta Metall. Michal, G., M., Moine, P., Sinclair, R. 1982; 30: 125-138
• A Morphological Study of ’Premartensitic’ Effects in TiNi Acta Metall. Moine, P., Michal, G., M.,  Sinclair, R. 1982; 30: 109-123
• Electron Irradiation Induced Crystalline Amorphous Transitions in Ni-Ti Alloys Scripta Met. Thomas, G., Mori, H., Fujita, H., Sinclair, R. 1982; 15: 589-592
• MARTENSITIC TRANSFORMATIONS IN A TINI THIN FOIL JOURNAL DE PHYSIQUE Moine, P., Goo, E., Sinclair, R. 1982; 43 (NC-4): 243-248

  View details for Web of Science ID A1982QE67200033

• A MORPHOLOGICAL-STUDY OF PRE-MARTENSITIC EFFECTS IN TINI ACTA METALLURGICA Moine, P., Michal, G. M., Sinclair, R. 1982; 30 (1): 109-123

  View details for Web of Science ID A1982MX59800014

• ROOM-TEMPERATURE DEFORMATION MECHANISMS AND THE DEFECT STRUCTURE OF TUNGSTEN CARBIDE ACTA METALLURGICA HIBBS, M. K., Sinclair, R. 1981; 29 (9): 1645-1654

  View details for Web of Science ID A1981MB66500011

• Room Temperature Deformation Mechanisms and the Defect Structure of Tungsten Carbide Acta Metall. Hibbs, M., K., Sinclair, R. 1981; 29: 1645-1654
• Metallurgical Applications of the 2 1/2 D TEM Technique Met. Trans. Sinclair, R., Michal, G., M., Yamashita, T. 1981; 12A: 1503-1512
• The Premartensitic State in TiNi Sinclair, R., Moine, P., Michal, G., M. 1981
• High Resolution Transmission Electron Microscopy of Semiconductor Materials Sinclair, R., Ponce, F., A., Bravman, J., C., Yamashita, T., Pirouz, P. 1981
• Imaging of Defects in Cadmium Telluride Using High Resolution Transmission Electron Microscopy Ponce, F., A., Yamashita, T., Bube, R., H., Sinclair, R. edited by Narayan, J., Tan, T., Y. 1981
• Recent Developments in Lattice Imaging of Materials in Annual Reviews of Materials Science Sinclair, R. edited by Huggins, R., A. Annual Reviews, Inc., Palo Alto, California. 1981: 427-439
• Atomic Motion on the Surface of a Cadmium Telluride Single Crystal Nature Sinclair, R., Yamashita, T., Ponce, F., A. 1981; 290: 386-388
• High Resolution Imaging of Semiconductor Interfaces Sinclair, R., Ponce, F., A., Yamashita, T., Bravman, J., C. 1981
• Native Tellurium Dioxide Layer on Cadmium Telluride: A High Resolution Electron Microscopy Study Appl. Phys. Lett. Ponce, F., A., Sinclair, R., Bube, R., H. 1981; 39: 951-953
• Chemical and Microstructural Analyses of Grain Boundaries in BaTiO-Based Dielectrics Mecartney, M., L., Sinclair, R., Ewell, G., J. edited by Levinson, L., M. 1981
• The Effect of Orientation, Grain Size and Polymorphism on Magnetic Properties of Sputtered Co-Re Thin Film Media IEEE Trans. Magn Chen, T., Yamashita, T., Sinclair, R. 1981; MAG-17: 3187-3189
• NATIVE TELLURIUM DIOXIDE LAYER ON CADMIUM TELLURIDE - A HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY APPLIED PHYSICS LETTERS Ponce, F. A., Sinclair, R., BUBE, R. H. 1981; 39 (12): 951-953

  View details for Web of Science ID A1981MU66000007

• Physical Properties of Ion-Implanted SEM-Annealed Silicon Regolini, J., L., Johnson, N., M., Sinclair, R., Sigmon, T., W., Gibbons, J., F. edited by White, C., W., Percey, P., S. 1980
• Analytical Electron Microscopy of Ferroelectric BaTiO3 Mecartney, M., L., Sinclair, R. 1980
• A Transmission Electron Microscopical Investigation of Phase Transformations in TiNi Moine, P., Michal, G., M., Sinclair, R. 1980
• Defect Structure of Deformed WC Hibbs, M., K., Sinclair, R. 1980
• Structure Imaging of Defects in Cadmium Telluride Ponce, F., Yamashita, T., Sinclair, R. 1980
• Comments on ’The Early Stages of the Transformation in Dilute Alloys of Titanium in Nickel Scripta Met. Laughlin, D., E., Sinclair, R., Tanner, L., E. 1980; 14: 373-376
• Combined High Resolution and Analytical TEM Studies of Phase-Separated Alloys Wu, C., K., Marshall, A., F., Thomas, G., Sinclair, R. 1980
• A Quantitative Assessment of the Capabilities of 2 1/2 D Microscopy for Analyzing Crystalline Solids Philos. Mag. Michal, G., M., Sinclair, R. 1980; A42: 691-704
• High Resolution Imaging of Cadmium Telluride Sinclair, R., Ponce, F., Yamashita, T., Pirouz, P. 1980
• Microanalysis by Lattice Imaging in Analytical Electron Microscopy Sinclair, R. edited by Hren, J., J., Goldstein, J., I., Joy, D., C. Plenum Press, New York. 1979: 507-534
• Lattice Fringe Imaging of Alloys Sinclair, R. 1979
• In-Situ Observations of Diffusionless Transformations in NiTi Michal, G., M., Sinclair, R. 1979
• Growth Relationships in NbSn-Cu Superconducting Composites Sinclair, R. edited by Kuhlman-Wilsdorf, D., Harrigan, W., C. 1979
• Origin of Stacking Faults in NiTi Martensite Sinclair, R. edited by Cowley, J., M., Cohen, J., B., Salamon, M., B. 1979
• Determination of Local Composition by Lattice Imaging Met. Trans.  Sinclair, R., Thomas, G. 1978; 9A: 373-380
• Aspects of Microanalysis in a TEM Sinclair, R., Jacobson, B., E. 1978
• Applications of Lattice Fringe Imaging Sinclair, R. 1978
• Modulated Substitutional-Intersitial Solute-Atom Clustering in Nitrided Austenitic Fe-34 Ni-V Alloys Driver, J., H., Sinclair, R., Jack, K., H. 1978
• Lattice Imaging and Optical Microanalysis of a Cu-Ni-Cr Spinodal Alloy Met. Trans. Wu, C.,  K., Sinclair, R.,  Thomas, G. 1978; 9A: 381-387
• Lattice Imaging Study of a Martensite-Austenite Interface Acta Metall. Sinclair, R., Mohamed, H., A. 1978; 26: 623-628
• Fine Structure of Interfaces as Revealed by Lattice Fringe Imaging Sinclair, R. 1977
• A Preliminary Lattice Image Investigation of Nickel-Titanium Martensite J. Phys. Sinclair, R. 1977; C7 (38): 453-456
• Structure of Ordered Alloys J. Phys.  Sinclair, R., Thomas, G. 1977; C7 (38): 165-171
• Lattice Image Studies of B19 Ordering and Interfacial Structures in Mg3Cd Acta Metall. Sinclair, R., Dutkiewicz, J. 1977; 25: 235-249
• Direct Observation and Characterization of Lattice Defects in Materials in Treatise on Materials Science and Technology Sinclair, R. edited by McCrone, R., K. Academic Press, New York. 1977: 1-45
• The Importance of Electron Diffraction to Transmission Electron Imaging Trans. Am. Cryst. Soc. Sinclair, R. 1977; 13: 101-126
• Discussion of An Electron Diffraction Study of Short-Range Order in Quenched Ni4Mo Alloy Acta Metall. Thomas, G., Sinclair, R. 1977; 25: 101-126
• Preliminary Observations of Electron Irradiation Damage in Short-Range Ordered Ni4Mo Sinclair, R., Gelles, D., S., Thomas, G. 1976
• Applications of High Resolution Electron Microscopy in Materials Science Report of Workshop on High Resolution Electron Microscopy edited by Thomas, G., Glaeser, R., M., Cowley, J., M. Lawrence Berkeley Laboratory Special Publication. 1976: 71-79
• Applications of High Resolution Electron Microscopy in Materials Science edited by Thomas, G., Glaeser, R., M., Cowley, J., M. 1976
• Optical Diffraction from Lattice Images of Alloys Acta Metall. Sinclair, R., Gronsky, R., Thomas, G. 1976; 24: 789-795
• Applications of High Resolution Electron Microscopy in Materials Science edited by Thomas, G., Glaeser, R., M., Cowley, J., M. 1976
• Lattice Image and Optical Diffraction Studies of Alloys Thomas, G., Sinclair, R., Gronsky, R. 1976
• Optical Microdiffraction in Lattice Image Analysis Gronsky, R., Sinclair, R., Thomas, G. 1976
• Observations of B19 Order ing in Mg3Cd Thin Foils Scripta Met. Dutkiewicz, J., Sinclair, R. 1976; 10: 489-493
• Analysis of Ordering in Cu3Au, Utilizing Lattice Imaging Techniques Acta Metall. Sinclair, R., Schneider, K.,  Thomas, G. 1975; 23: 873-883
• Studies of Atomic Scattering Factors from the Critical Voltage in Ordered Alloys: Applications to Cu3Au Rocher, A., Sinclair, R., Thomas, G. 1975
• Antiphase Domains and Diffraction Spot Splitting in Cu3Au J. Appl. Crystallography Sinclair, R., Thomas, G. 1975; 8: 206-211
• Lattice Image Studies of Ordered Alloys Sinclair, R., Dutkiewicz, J. 1975
• On the Lattice Parameter of Non-Random Solid Solutions Philos. Mag. Krawitz, A., Sinclair, R. 1975; 31: 697-712
• Lattice Imaging of Spinodal Alloys Gronsky, R., Okada, M., Sinclair, R., Thomas, G. 1975
• Applications of the Critical Voltage Effect for the Study of Ordering Philos. Mag. Sinclair, R., Goringe, M., J., Thomas, G. 1975; 32: 501-512
• Lattice Image Contrast of Ordered Domains in CuAu Sinclair, R., Thomas, G. 1974
• Spinodal Decomposition of a Nickel-Titanium Alloy Phys. Status Solidi A Sinclair, R., Leake, J., A., Ralph, B. 1974; 26: 285-298
• Lattice Imaging of Ordered Alloys Sinclair, R., Scheider, K., Thomas, G. 1974
• A New 1000C Double Tilt Stage for the Hitachi 650 kV Microscope Worthington, W., Kosel, T., Sinclair, R. 1974
• High Resolution Transmission Electron Microscopy Sinclair, R. 1973
• Measurement of Relative Bond Energies in Some Ordered Nickel-Based Alloys by Field-Ion Microscopy Phys. Status Solidi A Taunt, R., J., Sinclair, R., Ralph, B. 1973; 16: 469-484
• On the Determination of a Local Order Parameter in a Nickel-Titanium Alloy Philos. Mag. Sinclair, R., Ralph, B., Leake, J., A. 1973; 28: 1111-1123