High-resolution Soft-RIXS: Scientific Goals and Technical Challenges

Tuesday, November 22, 2011 - 3:30pm

Giacomo Ghiringhelli, CNR/SPIN and Dipartimento di Fisica, Politecnico di Milano, Italy Visiting scholar at SIMES-Department of physics, Stanford University

The interest in resonant inelastic soft x-ray scattering has been recently boosted mainly by results on high Tc superconductors and other cuprates, where orbital and magnetic excitations could be studied with unprecedented details. RIXS has thus demonstrated to be a valuable complement to inelastic neutron scattering and optical Raman scattering for the study of magnetic and electronic properties of strongly correlated 3d transition metal systems. Much of this success is due to the improvement of energy resolution in the experiments, which is limited more by intensity issues than by intrinsic technological constraints. In view of upcoming projects for high resolution RIXS at several synchrotron radiation and X-FEL sources around the world, what are the key features for the new instruments? How can we push the performances significantly ahead of the present status? What kind of new scientific results can we expect to tackle then by RIXS?

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